Assignee
ERICKSON ANDREW N
US·2 granted patents·6 citations·filing 2011–2012
Top patents by PatentIndex Score
2 records- 0169US9551743B2Apparatus and method for combined micro-scale and nano-scale C-V, Q-V, and I-V testing of semiconductor materialsERICKSON ANDREW N·Filed 2012·Granted Jan 24, 2017·2 cites·14 claims
- 0269US8800998B2Semiconductor wafer isolated transfer chuckERICKSON ANDREW N·Filed 2011·Granted Aug 12, 2014·4 cites·8 claims
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