Assignee
ESSAI INC
US·18 granted patents·11 pending applications·120 citations·filing 2006–2025
Top patents by PatentIndex Score
29 records- 0198US10908207B2Systems and methods for conforming device testers to integrated circuit device with pressure relief valveESSAI INC·Filed 2016·Granted Feb 2, 2021·31 cites·4 claims
- 0298US10126356B2Systems and methods for conforming test tooling to integrated circuit device with whirlwind cold plateESSAI INC·Filed 2016·Granted Nov 13, 2018·30 cites·17 claims
- 0396US11378588B2Contactor with angled depressible probes in shifted boresESSAI INC·Filed 2020·Granted Jul 5, 2022·3 cites·10 claims
- 0492US7663388B2Active thermal control unit for maintaining the set point temperature of a DUTESSAI INC·Filed 2008·Granted Feb 16, 2010·26 cites·16 claims
- 0589US10481175B2Contactor with angled depressible probesESSAI INC·Filed 2017·Granted Nov 19, 2019·3 cites·22 claims
- 0687US9804223B2Systems and methods for conforming test tooling to integrated circuit device with heater socketESSAI INC·Filed 2015·Granted Oct 31, 2017·4 cites·19 claims
- 0781US11293976B1Integrated circuit device test tooling with dual angle cavitiesESSAI INC·Filed 2020·Granted Apr 5, 2022·1 cites·7 claims
- 0880US7651340B2Chip actuator cover assemblyESSAI INC·Filed 2008·Granted Jan 26, 2010·10 cites·29 claims
- 0979US9007080B2Systems and methods for conforming device testers to integrated circuit device profiles with feedback temperature controlESSAI INC·Filed 2013·Granted Apr 14, 2015·4 cites·11 claims
- 1076US2024345132A1Hybrid shielding sockets with impedance tuning for integrated circuit device test toolingESSAI INC·Filed 2024·Application pending·0 cites
- 1173US9383406B2Systems and methods for conforming device testers to integrated circuit device with pressure relief valveESSAI INC·Filed 2014·Granted Jul 5, 2016·2 cites·3 claims
- 1272US2022413010A1Contactor with angled depressible probes in shifted boresESSAI INC·Filed 2022·Application pending·0 cites
- 1368US12085587B2Hybrid shielding sockets with impedance tuning for integrated circuit device test toolingESSAI INC·Filed 2021·Granted Sep 10, 2024·0 cites·7 claims
- 1468US9494642B2Systems and methods for conforming test tooling to integrated circuit device profiles with ejection mechanismsESSAI INC·Filed 2013·Granted Nov 15, 2016·2 cites·8 claims
- 1567US2020225264A1Contactor with angled depressible probesESSAI INC·Filed 2019·Application pending·0 cites
- 1663US7583097B2Contactor nest for an IC device and methodESSAI INC·Filed 2006·Granted Sep 1, 2009·4 cites·21 claims
- 1763US2026016533A1Test interconnect with integrated loopbacksESSAI INC·Filed 2025·Application pending·0 cites
- 1860US2025237697A1Systems and methods for tool-less, quick change elastomeric contact interfaces for integrated circuit testingESSAI INC·Filed 2024·Application pending·0 cites
- 1959US2026002985A1Test interconnect temperature control with gas flowESSAI INC·Filed 2024·Application pending·0 cites
- 2058US2025321267A1Versatile interposer with diagonal vias for testing of integrated circuit devicesESSAI INC·Filed 2024·Application pending·0 cites
- 2158US2025085309A1Low cross-talk interconnection device with impedance-tuned hybrid shielding structures for integrated circuit device test toolingESSAI INC·Filed 2024·Application pending·0 cites
- 2252US9557373B2Systems and methods for conforming test tooling to integrated circuit device profiles with convex support structureESSAI INC·Filed 2014·Granted Jan 31, 2017·0 cites·12 claims
- 2350US2026016501A1Test interconnect with conductive planes and components for power integrity and thermal managementESSAI INC·Filed 2024·Application pending·0 cites
- 2448US11906550B2Probe system for QFP integrated circuit device test toolingESSAI INC·Filed 2021·Granted Feb 20, 2024·0 cites·6 claims
- 2546US9229049B2Systems and methods for conforming test tooling to integrated circuit device profiles with compliant pedestalsESSAI INC·Filed 2013·Granted Jan 5, 2016·0 cites·12 claims
- 2645US2015022226A1Systems and methods for conforming test tooling to integrated circuit device profiles with coaxial socketESSAI INC·Filed 2014·Application pending·0 cites
- 2743US10094853B2Systems and methods for reliable integrated circuit device test toolingESSAI INC·Filed 2015·Granted Oct 9, 2018·0 cites·14 claims
- 2843US9279852B2Systems and methods for conforming test tooling to integrated circuit device profiles with sockets having secured and replaceable bushingsESSAI INC·Filed 2013·Granted Mar 8, 2016·0 cites·2 claims
- 2941US2020379010A1Systems and methods for high speed test probing of densely packaged semiconductor devicesESSAI INC·Filed 2020·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →