Assignee
FUJIMAKI RYOHEI
JP·8 granted patents·3 pending applications·9 citations·filing 2008–2014
Top patents by PatentIndex Score
11 records- 0163US8731881B2Multivariate data mixture model estimation device, mixture model estimation method, and mixture model estimation programFUJIMAKI RYOHEI·Filed 2012·Granted May 20, 2014·3 cites·17 claims
- 0259US8589397B2Data classification method and data classification deviceFUJIMAKI RYOHEI·Filed 2008·Granted Nov 19, 2013·2 cites·17 claims
- 0358US8447705B2Pattern generation method, pattern generation apparatus, and programFUJIMAKI RYOHEI·Filed 2008·Granted May 21, 2013·3 cites·6 claims
- 0455US8275735B2Diagnostic systemFUJIMAKI RYOHEI·Filed 2008·Granted Sep 25, 2012·1 cites·18 claims
- 0550US2013268288A1Device, method, and program for extracting abnormal event from medical information using feedback informationFUJIMAKI RYOHEI·Filed 2011·Application pending·0 cites
- 0647US2014214747A1Multivariate data mixture model estimation device, mixture model estimation method, and mixture model estimation programFUJIMAKI RYOHEI·Filed 2014·Application pending·0 cites
- 0742US9269118B2Device, method, and program for extracting abnormal event from medical informationFUJIMAKI RYOHEI·Filed 2011·Granted Feb 23, 2016·0 cites·11 claims
- 0840US9043261B2Latent variable model estimation apparatus, and methodFUJIMAKI RYOHEI·Filed 2012·Granted May 26, 2015·0 cites·9 claims
- 0938US9208436B2Model selection device, model selection method and model selection programFUJIMAKI RYOHEI·Filed 2011·Granted Dec 8, 2015·0 cites·12 claims
- 1038US9043645B2Malfunction analysis apparatus, malfunction analysis method, and recording mediumFUJIMAKI RYOHEI·Filed 2011·Granted May 26, 2015·0 cites·10 claims
- 1138US2014114890A1Probability model estimation device, method, and recording mediumFUJIMAKI RYOHEI·Filed 2012·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when FUJIMAKI RYOHEI files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →