Assignee
FUJITSU MICROELECTRONICS LTD
JP·458 granted patents·77 pending applications·3,326 citations·filing 2001–2010
Top patents by PatentIndex Score
535 records- 0198US7667227B2Semiconductor device and fabrication method thereofFUJITSU MICROELECTRONICS LTD·Filed 2009·Granted Feb 23, 2010·77 cites·4 claims
- 0298US7605041B2Semiconductor device and its manufacture methodFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Oct 20, 2009·122 cites·6 claims
- 0397US7645665B2Semiconductor device having shallow b-doped region and its manufactureFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Jan 12, 2010·125 cites·7 claims
- 0497US7500211B2Unit cell of semiconductor integrated circuit and wiring method and wiring program using unit cellFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Mar 3, 2009·132 cites·12 claims
- 0596US7583851B2Apparatus and method for processing an imageFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Sep 1, 2009·59 cites·14 claims
- 0696US7507666B2Manufacture method for semiconductor device having concave portions filled with conductor containing Cu as its main compositionFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Mar 24, 2009·49 cites·7 claims
- 0795US7671417B2Memory cell array, method of producing the same, and semiconductor memory device using the sameFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Mar 2, 2010·45 cites·14 claims
- 0895US7649232B2P-channel MOS transistor, semiconductor integrated circuit device and fabrication process thereofFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Jan 19, 2010·37 cites·13 claims
- 0995US7609039B2Controller and control method for DC-DC converterFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Oct 27, 2009·55 cites·17 claims
- 1095US7592241B2Semiconductor device having well with peak impurity concentrations and method for fabricating the sameFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Sep 22, 2009·112 cites·16 claims
- 1194US7598005B2Photomask and manufacturing method of the same, and pattern forming methodFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Oct 6, 2009·20 cites·9 claims
- 1294US7583553B2Semiconductor memory and refresh cycle control methodFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Sep 1, 2009·41 cites·17 claims
- 1393US7660184B2Semiconductor memory for disconnecting a bit line from a sense amplifier in a standby period and memory system including the semiconductor memoryFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Feb 9, 2010·26 cites·29 claims
- 1493US7598541B2Semiconductor device comprising transistor pair isolated by trench isolationFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Oct 6, 2009·114 cites·12 claims
- 1592US7601576B2Method for fabricating semiconductor deviceFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Oct 13, 2009·24 cites·18 claims
- 1692US7550844B2Semiconductor device and manufacturing method thereofFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Jun 23, 2009·18 cites·9 claims
- 1791US7579617B2Semiconductor device and production method thereofFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Aug 25, 2009·18 cites·11 claims
- 1891US7533192B2Task scheduling method in case of simultaneous transfer of compressed data and non-compressed dataFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted May 12, 2009·17 cites·13 claims
- 1991US7507659B2Fabrication process of a semiconductor deviceFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Mar 24, 2009·23 cites·12 claims
- 2090US7611984B2Manufacture method for semiconductor device having improved copper diffusion preventive function of plugs and wirings made of copper or copper alloyFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Nov 3, 2009·17 cites·9 claims
- 2190US7564111B2Imaging apparatusFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Jul 21, 2009·15 cites·15 claims
- 2290US7514355B2Multilayer interconnection structure and method for forming the sameFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Apr 7, 2009·47 cites·3 claims
- 2389US7692315B2Semiconductor device and method for manufacturing the sameFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Apr 6, 2010·15 cites·21 claims
- 2489US7633107B2Semiconductor device and manufacturing method thereofFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Dec 15, 2009·16 cites·6 claims
- 2589US7626616B2Automatic gain control circuit with exposure control circuitFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Dec 1, 2009·14 cites·14 claims
- 2689US7626234B2Semiconductor device with shallow trench isolation and its manufacture methodFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Dec 1, 2009·13 cites·9 claims
- 2789US7598557B2Semiconductor device and method for fabricating a semicondutor device including first and second hydrogen diffusion preventing filmsFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Oct 6, 2009·13 cites·24 claims
- 2889US7554305B2Linear regulator with discharging gate driverFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Jun 30, 2009·46 cites·6 claims
- 2989US7511331B2Semiconductor device having side wall spacersFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Mar 31, 2009·12 cites·7 claims
- 3088US7688661B2Semiconductor memory device, and method of controlling the sameFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Mar 30, 2010·8 cites·25 claims
- 3188US7642551B2Wafer-level package having test terminalFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Jan 5, 2010·11 cites·1 claims
- 3288US7592873B2Low noise amplifierFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Sep 22, 2009·16 cites·19 claims
- 3388US7518173B2Semiconductor device having ferroelectric capacitor and its manufacture methodFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Apr 14, 2009·19 cites·6 claims
- 3487US7734973B2Testing apparatus and testing method for an integrated circuit, and integrated circuitFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Jun 8, 2010·17 cites·4 claims
- 3587US7683362B2Semiconductor device and production method thereofFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Mar 23, 2010·13 cites·19 claims
- 3687US7580963B2Semiconductor device having an arithmetic unit of a reconfigurable circuit configuration in accordance with stored configuration data and a memory storing fixed value data to be supplied to the arithmetic unit, requiring no data area for storing fixed value data to be set in a configuration memoryFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Aug 25, 2009·20 cites·10 claims
- 3787US7580303B2Semiconductor memory having a precharge voltage generation circuit for reducing power consumptionFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Aug 25, 2009·21 cites·20 claims
- 3887US7557846B2Solid-state image sensor including common transistors between pixelsFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Jul 7, 2009·32 cites·56 claims
- 3986US7679411B2Reset signal generation circuitFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Mar 16, 2010·18 cites·12 claims
- 4086US7626215B2Semiconductor device and method of manufacturing the sameFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Dec 1, 2009·9 cites·12 claims
- 4186US7616250B2Image capturing deviceFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Nov 10, 2009·44 cites·11 claims
- 4286US7592657B2Semiconductor device and method of manufacturing the sameFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Sep 22, 2009·8 cites·10 claims
- 4386US7572172B2Polishing machine, workpiece supporting table pad, polishing method and manufacturing method of semiconductor deviceFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Aug 11, 2009·18 cites·4 claims
- 4485US7719097B2Semiconductor device having transparent memberFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted May 18, 2010·11 cites·14 claims
- 4585US7631200B2Host apparatus, device, and method for controlling communication systemFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Dec 8, 2009·16 cites·6 claims
- 4685US7598007B2Pattern transfer mask, focus variation measuring method and apparatus, and semiconductor device manufacturing methodFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Oct 6, 2009·7 cites·6 claims
- 4785US7598162B2Method of manufacturing semiconductor deviceFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Oct 6, 2009·11 cites·22 claims
- 4885US7592655B2MOS image sensorFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Sep 22, 2009·17 cites·15 claims
- 4985US7592214B2Method of manufacturing a semiconductor device including epitaxially growing semiconductor epitaxial layers on a surface of semiconductor substrateFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Sep 22, 2009·10 cites·9 claims
- 5085US7586185B2Semiconductor device having a functional surfaceFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Sep 8, 2009·12 cites·11 claims
Showing the top 50 of 535 patent records by PatentIndex Score.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →