Assignee
FUKUDA DAISUKE
JP·6 granted patents·1 pending application·10 citations·filing 2006–2012
Top patents by PatentIndex Score
7 records- 0177US8154851B2Dielectric ceramic, manufacturing method thereof, and multilayer ceramic capacitorFUKUDA DAISUKE·Filed 2006·Granted Apr 10, 2012·5 cites·5 claims
- 0264US8667433B2Polishing estimation/evaluation device, overpolishing condition calculation device, and computer-readable non-transitory medium thereofFUKUDA DAISUKE·Filed 2012·Granted Mar 4, 2014·1 cites·4 claims
- 0362US8104008B2Layout design apparatus, layout design method, and computer productFUKUDA DAISUKE·Filed 2008·Granted Jan 24, 2012·2 cites·12 claims
- 0461US8082536B2Semiconductor integrated circuit manufacturing process evaluation methodFUKUDA DAISUKE·Filed 2009·Granted Dec 20, 2011·1 cites·6 claims
- 0560US8219375B2Plated film thickness calculating method and plated film thickness calculating deviceFUKUDA DAISUKE·Filed 2009·Granted Jul 10, 2012·1 cites·6 claims
- 0647US8499259B2Polishing estimation/evaluation device, overpolishing condition calculation device, and computer-readable non-transitory medium thereofFUKUDA DAISUKE·Filed 2011·Granted Jul 30, 2013·0 cites·5 claims
- 0737US2012007637A1Load driver systemFUKUDA DAISUKE·Filed 2011·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →