Assignee
FUKUHARA NOBORU
JP·1 granted patent·1 pending application·2 citations·filing 2009–2011
Top patents by PatentIndex Score
2 records- 0164US8610450B2Method of measuring electrical characteristics of semiconductor waferFUKUHARA NOBORU·Filed 2011·Granted Dec 17, 2013·2 cites·13 claims
- 0239US2011141076A1Semiconductor device, method for manufacturing semiconductor device, transistor substrate, light emitting device and display deviceFUKUHARA NOBORU·Filed 2009·Application pending·0 cites
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