Assignee
FUKUMA TAKESHI
JP·3 granted patents·9 citations·filing 2009–2012
Top patents by PatentIndex Score
3 records- 0174US8839461B2Potential measurement device and atomic force microscopeFUKUMA TAKESHI·Filed 2012·Granted Sep 16, 2014·5 cites·5 claims
- 0267US8341760B2Scanning probe microscopeFUKUMA TAKESHI·Filed 2010·Granted Dec 25, 2012·3 cites·13 claims
- 0349US8217367B2Scanner device for scanning probe microscopeFUKUMA TAKESHI·Filed 2009·Granted Jul 10, 2012·1 cites·13 claims
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