Assignee
FUNAKOSHI TOMOHIRO
JP·1 granted patent·2 pending applications·4 citations·filing 2009–2011
Top patents by PatentIndex Score
3 records- 0174US8209135B2Wafer inspection data handling and defect review toolFUNAKOSHI TOMOHIRO·Filed 2011·Granted Jun 26, 2012·4 cites·10 claims
- 0237US2011150318A1Data processing system, data processing method, and inspection assist systemFUNAKOSHI TOMOHIRO·Filed 2009·Application pending·0 cites
- 0331US2012233542A1Defect review support device, defect review device and inspection support deviceFUNAKOSHI TOMOHIRO·Filed 2010·Application pending·0 cites
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