Assignee
GE ZONGTAO
JP·1 granted patent·6 pending applications·0 citations·filing 2009–2011
Top patents by PatentIndex Score
7 records- 0144US2009309957A1Omnidirectional imaging apparatusGE ZONGTAO·Filed 2009·Application pending·0 cites
- 0236US8059278B2Optical wave interference measuring apparatusGE ZONGTAO·Filed 2009·Granted Nov 15, 2011·0 cites·5 claims
- 0335US2010201992A1Lightwave interference measurement deviceGE ZONGTAO·Filed 2009·Application pending·0 cites
- 0431US2010246900A1Method and apparatus of measuring positional variation of rotation center lineGE ZONGTAO·Filed 2010·Application pending·0 cites
- 0530US2010309458A1Asphere measurement method and apparatusGE ZONGTAO·Filed 2010·Application pending·0 cites
- 0628US2011304856A1Lightwave interference measurement apparatusGE ZONGTAO·Filed 2011·Application pending·0 cites
- 0725US2010231923A1Three-dimensional shape measuring method and deviceGE ZONGTAO·Filed 2010·Application pending·0 cites
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