Assignee
GENRAD INC
US·62 granted patents·2,217 citations·filing 1976–2001
Top patents by PatentIndex Score
62 records- 0192US6138143AMethod and apparatus for asynchronous transaction processingGENRAD INC·Filed 1999·Granted Oct 24, 2000·323 cites·39 claims
- 0292US5506510AAdaptive alignment probe fixture for circuit board testerGENRAD INC·Filed 1994·Granted Apr 9, 1996·89 cites·30 claims
- 0391US4242751AAutomatic fault-probing method and apparatus for checking electrical circuits and the likeGENRAD INC·Filed 1978·Granted Dec 30, 1980·67 cites·12 claims
- 0489US6393458B1Method and apparatus for load balancing in a distributed object architectureGENRAD INC·Filed 1999·Granted May 21, 2002·219 cites·16 claims
- 0589US6175230B1Circuit-board tester with backdrive-based burst timingGENRAD INC·Filed 1999·Granted Jan 16, 2001·110 cites·7 claims
- 0688US5861743AHybrid scanner for use in an improved MDA testerGENRAD INC·Filed 1995·Granted Jan 19, 1999·89 cites·7 claims
- 0788US4196475AMethod of and apparatus for automatic measurement of impedance or other parameters with microprocessor calculation techniquesGENRAD INC·Filed 1976·Granted Apr 1, 1980·46 cites·33 claims
- 0887US4228537AMethod of and apparatus for automatic fault diagnosis of electrical circuits employing on-line simulation of faults in such circuits during diagnosisGENRAD INC·Filed 1978·Granted Oct 14, 1980·76 cites·9 claims
- 0981US4808815AApparatus for testing light-emitting devices using probe means having a preselected pattern arrangementGENRAD INC·Filed 1987·Granted Feb 28, 1989·51 cites·14 claims
- 1080US6550669B1Integral heating nozzle and pickup tubeGENRAD INC·Filed 2001·Granted Apr 22, 2003·29 cites·10 claims
- 1180US4236246AMethod of and apparatus for testing electronic circuit assemblies and the likeGENRAD INC·Filed 1978·Granted Nov 25, 1980·31 cites·15 claims
- 1279US4782324ADigital signal synthesizerGENRAD INC·Filed 1987·Granted Nov 1, 1988·30 cites·22 claims
- 1377US4977370AApparatus and method for circuit board testingGENRAD INC·Filed 1988·Granted Dec 11, 1990·55 cites·2 claims
- 1476US5172377AMethod for testing mixed scan and non-scan circuitryGENRAD INC·Filed 1990·Granted Dec 15, 1992·43 cites·20 claims
- 1574US5736862ASystem for detecting faults in connections between integrated circuits and circuit board tracesGENRAD INC·Filed 1995·Granted Apr 7, 1998·39 cites·11 claims
- 1671US5748672ASystem for measuring jitter in a non-binary digital signalGENRAD INC·Filed 1995·Granted May 5, 1998·85 cites·15 claims
- 1771US5486753ASimultaneous capacitive open-circuit testingGENRAD INC·Filed 1994·Granted Jan 23, 1996·37 cites·2 claims
- 1871US4242631AFront-end circuit apparatus for impedance measurements and the likeGENRAD INC·Filed 1978·Granted Dec 30, 1980·20 cites·10 claims
- 1970US4414664AWait circuitry for interfacing between field maintenance processor and device specific adaptor circuitGENRAD INC·Filed 1981·Granted Nov 8, 1983·23 cites·13 claims
- 2070US4342089AMethod of and apparatus for automatic measurement of circuit parameters with microprocessor calculation techniquesGENRAD INC·Filed 1979·Granted Jul 27, 1982·20 cites·22 claims
- 2169US5391993ACapacitive open-circuit test employing threshold determinationGENRAD INC·Filed 1994·Granted Feb 21, 1995·26 cites·8 claims
- 2269US5124638AAutomatic circuit tester employing a three-dimensional switch-matrix layoutGENRAD INC·Filed 1991·Granted Jun 23, 1992·36 cites·16 claims
- 2369US4290013AMethod of and apparatus for electrical short testing and the likeGENRAD INC·Filed 1979·Granted Sep 15, 1981·18 cites·20 claims
- 2468US5124636ATester interconnect systemGENRAD INC·Filed 1991·Granted Jun 23, 1992·37 cites·7 claims
- 2566US5057775AMethod of testing control matrices for flat-panel displaysGENRAD INC·Filed 1990·Granted Oct 15, 1991·34 cites·15 claims
- 2666US4459693AMethod of and apparatus for the automatic diagnosis of the failure of electrical devices connected to common bus nodes and the likeGENRAD INC·Filed 1982·Granted Jul 10, 1984·44 cites·31 claims
- 2764US4520416AShunt-foldback voltage sourceGENRAD INC·Filed 1984·Granted May 28, 1985·14 cites·1 claims
- 2862US5127009AMethod and apparatus for circuit board testing with controlled backdrive stressGENRAD INC·Filed 1989·Granted Jun 30, 1992·19 cites·23 claims
- 2961US5282211ASlip detection during bit-error-rate measurementGENRAD INC·Filed 1991·Granted Jan 25, 1994·34 cites·6 claims
- 3061US4951283AMethod and apparatus for identifying defective bus devicesGENRAD INC·Filed 1988·Granted Aug 21, 1990·34 cites·13 claims
- 3160US5457380ACircuit-test fixture that includes shorted-together probesGENRAD INC·Filed 1994·Granted Oct 10, 1995·20 cites·3 claims
- 3260US5027298ALow-dead-time interval timerGENRAD INC·Filed 1989·Granted Jun 25, 1991·18 cites·28 claims
- 3359US6363217B1Convective heater employing foam metal diffuserGENRAD INC·Filed 2001·Granted Mar 26, 2002·12 cites·11 claims
- 3458US4937535ACalibration method and programmable phase-gain amplifierGENRAD INC·Filed 1988·Granted Jun 26, 1990·21 cites·24 claims
- 3557US4764694AInterpolating time-measurement apparatusGENRAD INC·Filed 1987·Granted Aug 16, 1988·19 cites·3 claims
- 3657US4686391AFast-acting comparison circuitGENRAD INC·Filed 1986·Granted Aug 11, 1987·11 cites·6 claims
- 3756US5786697ACapacitive open-circuit and short-circuit tests of component connections to circuit boardsGENRAD INC·Filed 1995·Granted Jul 28, 1998·17 cites·3 claims
- 3856US4300846AHigh speed print head system and methodGENRAD INC·Filed 1979·Granted Nov 17, 1981·9 cites·19 claims
- 3955US4342959AMethod of electrical short testing and the likeGENRAD INC·Filed 1981·Granted Aug 3, 1982·15 cites·4 claims
- 4053US4862069AMethod of in-circuit testingGENRAD INC·Filed 1987·Granted Aug 29, 1989·18 cites·5 claims
- 4153US4727312ACircuit testerGENRAD INC·Filed 1985·Granted Feb 23, 1988·15 cites·2 claims
- 4252US5414715AMethod for automatic open-circuit detectionGENRAD INC·Filed 1993·Granted May 9, 1995·17 cites·9 claims
- 4352US5101150AAutomatic circuit tester with separate instrument and scanner busesGENRAD INC·Filed 1991·Granted Mar 31, 1992·21 cites·3 claims
- 4451US4523154AEnhanced-accuracy semiconductor power amplifierGENRAD INC·Filed 1983·Granted Jun 11, 1985·8 cites·3 claims
- 4550US5602490AConnector for automatic test equipmentGENRAD INC·Filed 1995·Granted Feb 11, 1997·13 cites·26 claims
- 4650US4594558AHigh-switching-speed d.c. amplifier with input-offset current compensationGENRAD INC·Filed 1985·Granted Jun 10, 1986·9 cites·11 claims
- 4747US4554630AControl apparatus for back-driving computer memory and forcing execution of idle loop program in external memoryGENRAD INC·Filed 1981·Granted Nov 19, 1985·17 cites·6 claims
- 4846US4931742ASelf-protecting power bus testing systemGENRAD INC·Filed 1989·Granted Jun 5, 1990·14 cites·7 claims
- 4946US4740895AMethod of and apparatus for external control of computer program flowGENRAD INC·Filed 1987·Granted Apr 26, 1988·17 cites·12 claims
- 5046US4569048AMethod and apparatus for memory overlayGENRAD INC·Filed 1983·Granted Feb 4, 1986·17 cites·6 claims
Showing the top 50 of 62 patent records by PatentIndex Score.
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