Assignee
GLOBITECH INC
US·6 granted patents·1 pending application·34 citations·filing 1998–2004
Top patents by PatentIndex Score
7 records- 0170US6921943B2System and method for reducing soft error rate utilizing customized epitaxial layersGLOBITECH INC·Filed 2003·Granted Jul 26, 2005·19 cites·9 claims
- 0248US7250358B2Wafer for preventing the formation of silicon nodules and method for preventing the formation of silicon nodulesGLOBITECH INC·Filed 2004·Granted Jul 31, 2007·4 cites·26 claims
- 0345US6279373B1Automatic reference-pressure balance methodGLOBITECH INC·Filed 1999·Granted Aug 28, 2001·11 cites·15 claims
- 0437US6482659B2Post-epitaxial thermal oxidation for reducing microsteps on polished semiconductor wafersGLOBITECH INC·Filed 2002·Granted Nov 19, 2002·0 cites·1 claims
- 0532US2002002856A1Automatic reference-pressure balance methodGLOBITECH INC·Filed 2001·Application pending·0 cites
- 0625US6389326B2Differential process control methodGLOBITECH INC·Filed 1998·Granted May 14, 2002·0 cites·3 claims
- 0725US6372521B1Post epitaxial thermal oxidationGLOBITECH INC·Filed 1999·Granted Apr 16, 2002·0 cites·2 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →