Assignee
GUO RUIFENG
US·7 granted patents·1 pending application·56 citations·filing 2007–2012
Technology mixG01R8
Top patents by PatentIndex Score
8 records- 0190US8316265B2Test pattern generation for diagnosing scan chain failuresGUO RUIFENG·Filed 2009·Granted Nov 20, 2012·17 cites·35 claims
- 0289US8261142B2Generating test sets for diagnosing scan chain failuresGUO RUIFENG·Filed 2008·Granted Sep 4, 2012·14 cites·23 claims
- 0380US9086459B2Detection and diagnosis of scan cell internal defectsGUO RUIFENG·Filed 2009·Granted Jul 21, 2015·10 cites·14 claims
- 0479US8935582B2Generating test sets for diagnosing scan chain failuresGUO RUIFENG·Filed 2012·Granted Jan 13, 2015·3 cites·14 claims
- 0579US8615695B2Fault dictionary-based scan chain failure diagnosisGUO RUIFENG·Filed 2007·Granted Dec 24, 2013·8 cites·36 claims
- 0679US8527232B2Diagnostic test pattern generation for small delay defectGUO RUIFENG·Filed 2010·Granted Sep 3, 2013·4 cites·12 claims
- 0744US8468409B2Speed-path debug using at-speed scan test patternsGUO RUIFENG·Filed 2009·Granted Jun 18, 2013·0 cites·33 claims
- 0841US2011035638A1Timing Failure DebugGUO RUIFENG·Filed 2009·Application pending·0 cites
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