Assignee
HAMAGUCHI TAKUYA
JP·2 granted patents·3 citations·filing 2007–2012
Top patents by PatentIndex Score
2 records- 0155US8390097B2Insulated gate bipolar transistor having contact region with variable widthHAMAGUCHI TAKUYA·Filed 2007·Granted Mar 5, 2013·2 cites·18 claims
- 0252US9153502B2Semiconductor chip testing method and semiconductor chip testing deviceHAMAGUCHI TAKUYA·Filed 2012·Granted Oct 6, 2015·1 cites·20 claims
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