Assignee
HATANO MICHIO
JP·3 granted patents·1 pending application·10 citations·filing 2008–2010
Top patents by PatentIndex Score
4 records- 0180US8217363B2Scanning electron microscopeHATANO MICHIO·Filed 2008·Granted Jul 10, 2012·6 cites·5 claims
- 0267US9202667B2Charged particle radiation device with bandpass detectionHATANO MICHIO·Filed 2010·Granted Dec 1, 2015·2 cites·11 claims
- 0365US8097848B2Scanning electron microscopeHATANO MICHIO·Filed 2009·Granted Jan 17, 2012·2 cites·20 claims
- 0458US2010090109A1Scanning electron microscopeHATANO MICHIO·Filed 2009·Application pending·0 cites
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