Assignee
HAUNSCHILD JONAS
DE·2 granted patents·1 citations·filing 2010–2010
Top patents by PatentIndex Score
2 records- 0149US9435740B2Method for measuring a semiconductor structure, which is a solar cell or a precursor of a solar cellHAUNSCHILD JONAS·Filed 2010·Granted Sep 6, 2016·1 cites·15 claims
- 0223US9124214B2Method for spatially determining the series resistance of a semiconductor structureHAUNSCHILD JONAS·Filed 2010·Granted Sep 1, 2015·0 cites·10 claims
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