Assignee
HAYASHI MASATO
JP·2 granted patents·1 pending application·41 citations·filing 2007–2012
Top patents by PatentIndex Score
3 records- 0194US8333114B2Microstructure inspecting device, and microstructure inspecting methodHAYASHI MASATO·Filed 2008·Granted Dec 18, 2012·41 cites·8 claims
- 0250US8130593B2Pressure wave generator and temperature controlling method thereofHAYASHI MASATO·Filed 2007·Granted Mar 6, 2012·0 cites·13 claims
- 0336US2012275484A1Temperature measuring device, temperature calibrating device and temperature calibrating methodHAYASHI MASATO·Filed 2012·Application pending·0 cites
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