Assignee
HELMUT FISCHER GMBH & CO
DE·5 granted patents·167 citations·filing 1998–2001
Top patents by PatentIndex Score
5 records- 0186US6038280AMethod and apparatus for measuring the thicknesses of thin layers by means of x-ray fluorescenceHELMUT FISCHER GMBH & CO·Filed 1998·Granted Mar 14, 2000·84 cites·13 claims
- 0285US6118844AMethod and device for the determination of measurement uncertainties in X-ray fluorescence layer thicknessHELMUT FISCHER GMBH & CO·Filed 1998·Granted Sep 12, 2000·60 cites·21 claims
- 0370US6824657B1Component supportHELMUT FISCHER GMBH & CO·Filed 2000·Granted Nov 30, 2004·6 cites·42 claims
- 0467US6777930B2Sequentially non-destructive thickness measurementHELMUT FISCHER GMBH & CO·Filed 2001·Granted Aug 17, 2004·13 cites·23 claims
- 0549US6438209B1Apparatus for guiding X-raysHELMUT FISCHER GMBH & CO·Filed 2000·Granted Aug 20, 2002·4 cites·15 claims
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