Assignee
HERMES MICROVISION INC TAIWAN
TW·1 granted patent·1 pending application·20 citations·filing 2007–2007
Top patents by PatentIndex Score
2 records- 0189US7705298B2System and method to determine focus parameters during an electron beam inspectionHERMES MICROVISION INC TAIWAN·Filed 2007·Granted Apr 27, 2010·20 cites·10 claims
- 0243US2008296496A1Method and apparatus of wafer surface potential regulationHERMES MICROVISION INC TAIWAN·Filed 2007·Application pending·0 cites
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