Assignee
HIGASHI SEIICHIRO
JP·3 granted patents·2 citations·filing 2006–2011
Top patents by PatentIndex Score
3 records- 0159US8419272B2Temperature measuring device, thermal treatment device using the same, temperature measuring methodHIGASHI SEIICHIRO·Filed 2006·Granted Apr 16, 2013·1 cites·19 claims
- 0258US8704747B2Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devicesHIGASHI SEIICHIRO·Filed 2011·Granted Apr 22, 2014·0 cites·13 claims
- 0351US8900953B2Crystal manufacturing apparatus, semiconductor device manufactured using the same, and method of manufacturing semiconductor device using the sameHIGASHI SEIICHIRO·Filed 2009·Granted Dec 2, 2014·1 cites·2 claims
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