Assignee
HIRAI TAKEHIRO
JP·5 granted patents·14 citations·filing 2010–2012
Top patents by PatentIndex Score
5 records- 0178US9020237B2Method for optimizing observed image classification criterion and image classification apparatusHIRAI TAKEHIRO·Filed 2011·Granted Apr 28, 2015·6 cites·6 claims
- 0276US9280814B2Charged particle beam apparatus that performs image classification assistanceHIRAI TAKEHIRO·Filed 2012·Granted Mar 8, 2016·4 cites·9 claims
- 0374US8341518B2Report format setting method and apparatus, and defect review systemHIRAI TAKEHIRO·Filed 2010·Granted Dec 25, 2012·3 cites·7 claims
- 0465US8108172B2Defect review apparatus and method of reviewing defectsHIRAI TAKEHIRO·Filed 2010·Granted Jan 31, 2012·1 cites·9 claims
- 0536US9136189B2Surface observation apparatus and surface observation methodHIRAI TAKEHIRO·Filed 2010·Granted Sep 15, 2015·0 cites·21 claims
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