Assignee
HITACHI KENKI FINETECH CO LTD
JP·3 granted patents·18 citations·filing 2002–2004
Top patents by PatentIndex Score
3 records- 0161US6698291B2Ultrasonic inspection apparatusHITACHI KENKI FINETECH CO LTD·Filed 2003·Granted Mar 2, 2004·7 cites·5 claims
- 0257US7333191B2Scanning probe microscope and measurement method using the sameHITACHI KENKI FINETECH CO LTD·Filed 2004·Granted Feb 19, 2008·11 cites·10 claims
- 0328US6745617B2Scanning probe microscopeHITACHI KENKI FINETECH CO LTD·Filed 2002·Granted Jun 8, 2004·0 cites·1 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →