Assignee
HYUNDAI ELECTROMICS IND CO LTD
KR·2 granted patents·77 citations·filing 1996–2002
Top patents by PatentIndex Score
2 records- 0180US5766809AMethod for testing overlay in a semiconductor device utilizing inclined measuring markHYUNDAI ELECTROMICS IND CO LTD·Filed 1996·Granted Jun 16, 1998·66 cites·14 claims
- 0264US6682957B2Semiconductor substrate and land grid array semiconductor package using same and fabrication methods thereofHYUNDAI ELECTROMICS IND CO LTD·Filed 2002·Granted Jan 27, 2004·11 cites·19 claims
Join the waitlist — get patent alerts
Get an alert when HYUNDAI ELECTROMICS IND CO LTD files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →