Assignee
ICOS VISION SYSTEMS NV
BE·12 granted patents·2 pending applications·184 citations·filing 1991–2009
Top patents by PatentIndex Score
14 records- 0184US7609388B2Spatial wavefront analysis and 3D measurementICOS VISION SYSTEMS NV·Filed 2002·Granted Oct 27, 2009·28 cites·74 claims
- 0284US7327470B2Spatial and spectral wavefront analysis and measurementICOS VISION SYSTEMS NV·Filed 2004·Granted Feb 5, 2008·14 cites·6 claims
- 0379US6778282B1Measuring positions of coplanarity of contract elements of an electronic component with a flat illumination and two camerasICOS VISION SYSTEMS NV·Filed 2000·Granted Aug 17, 2004·29 cites·8 claims
- 0478US7446885B2Device for measuring in three dimensions a topographical shape of an objectICOS VISION SYSTEMS NV·Filed 2003·Granted Nov 4, 2008·34 cites·18 claims
- 0577US7542144B2Spatial and spectral wavefront analysis and measurementICOS VISION SYSTEMS NV·Filed 2007·Granted Jun 2, 2009·4 cites·2 claims
- 0671US6970238B2System for inspecting the surfaces of objectsICOS VISION SYSTEMS NV·Filed 2001·Granted Nov 29, 2005·11 cites·20 claims
- 0765US7434856B2Gripper and method of operating the sameICOS VISION SYSTEMS NV·Filed 2003·Granted Oct 14, 2008·10 cites·7 claims
- 0863US7427731B2Illumination unit and method for the operation thereofICOS VISION SYSTEMS NV·Filed 2005·Granted Sep 23, 2008·3 cites·13 claims
- 0963US5440391AMethod and device for determining a position of at least one lead of an electronic componentICOS VISION SYSTEMS NV·Filed 1991·Granted Aug 8, 1995·36 cites·16 claims
- 1052US7423743B2Method and an apparatus for measuring positions of contact elements of an electronic componentICOS VISION SYSTEMS NV·Filed 2002·Granted Sep 9, 2008·9 cites·9 claims
- 1151US7222720B2Device for transferring electronic components from an inclined supply track to another elementICOS VISION SYSTEMS NV·Filed 2002·Granted May 29, 2007·4 cites·13 claims
- 1246US7361921B2Device and method for plane-parallel orientation of a the surface of an object to be examined in relation to a focus plane of a lensICOS VISION SYSTEMS NV·Filed 2004·Granted Apr 22, 2008·2 cites·7 claims
- 1341US2011149298A1Spatial wavefront analysis and 3d measurementICOS VISION SYSTEMS NV·Filed 2009·Application pending·0 cites
- 1437US2007023716A1Apparatus for three dimensional measuring on an electronic componentICOS VISION SYSTEMS NV·Filed 2005·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →