Assignee
IMURA KENJI
JP·7 granted patents·55 citations·filing 2004–2012
Top patents by PatentIndex Score
7 records- 0196US8130371B2Method of calibrating reflection characteristic measuring apparatus for sheet specimenIMURA KENJI·Filed 2011·Granted Mar 6, 2012·23 cites·4 claims
- 0287US8288739B2Method and apparatus for measuring optical property of fluorescent sampleIMURA KENJI·Filed 2009·Granted Oct 16, 2012·11 cites·9 claims
- 0378US7286215B2Light measuring apparatus and a method for correcting non-linearity of a light measuring apparatusIMURA KENJI·Filed 2004·Granted Oct 23, 2007·15 cites·8 claims
- 0473US8115924B2Optical characteristic measuring apparatusIMURA KENJI·Filed 2009·Granted Feb 14, 2012·3 cites·7 claims
- 0563US8502980B2Spectral characteristic measuring system, spectral characteristic measuring instrument, and data processing deviceIMURA KENJI·Filed 2009·Granted Aug 6, 2013·3 cites·6 claims
- 0643US8064133B2Light receiving optical system, and spectrophotometer incorporated with the sameIMURA KENJI·Filed 2008·Granted Nov 22, 2011·0 cites·6 claims
- 0741US8767206B2Spectral characteristic measuring device, method for correcting spectral characteristic measuring device, and non-transitory computer readable recording mediumIMURA KENJI·Filed 2012·Granted Jul 1, 2014·0 cites·16 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →