Assignee
INST OF MICROELECTRONICS CAS
CN·294 granted patents·146 pending applications·373 citations·filing 2010–2025
Top patents by PatentIndex Score
440 records- 0198US11081484B2IC unit and method of manufacturing the same, and electronic device including the sameINST OF MICROELECTRONICS CAS·Filed 2020·Granted Aug 3, 2021·9 cites·31 claims
- 0296US11677001B2Semiconductor device with c-shaped channel portion, method of manufacturing the same, and electronic apparatus including the sameINST OF MICROELECTRONICS CAS·Filed 2021·Granted Jun 13, 2023·3 cites·38 claims
- 0396US10714398B2Semiconductor device, method of manufacturing the same and electronic device including the deviceINST OF MICROELECTRONICS CAS·Filed 2017·Granted Jul 14, 2020·7 cites·24 claims
- 0495US11810986B2Method for integrating surface-electrode ion trap and silicon photoelectronic device, integrated structure, and three-dimensional structureINST OF MICROELECTRONICS CAS·Filed 2020·Granted Nov 7, 2023·3 cites·20 claims
- 0595US11127783B2MRAM, method of manufacturing the same, and electronic device including the MRAMINST OF MICROELECTRONICS CAS·Filed 2018·Granted Sep 21, 2021·7 cites·34 claims
- 0695US10475935B2Nanometer semiconductor devices having high-quality epitaxial layerINST OF MICROELECTRONICS CAS·Filed 2016·Granted Nov 12, 2019·12 cites·15 claims
- 0795US9613981B2Vertical channel-type 3D semiconductor memory device and method for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2016·Granted Apr 4, 2017·16 cites·11 claims
- 0894US11810902B2Semiconductor device with sidewall interconnection structure, method of manufacturing the same, and electronic apparatusINST OF MICROELECTRONICS CAS·Filed 2021·Granted Nov 7, 2023·2 cites·29 claims
- 0994US11749650B2Semiconductor device with sidewall interconnection structure, method of manufacturing the same, and electronic apparatusINST OF MICROELECTRONICS CAS·Filed 2021·Granted Sep 5, 2023·2 cites·17 claims
- 1094US10629498B2IC unit and methond of manufacturing the same, and electronic device including the sameINST OF MICROELECTRONICS CAS·Filed 2017·Granted Apr 21, 2020·7 cites·21 claims
- 1194US8361869B2Method for manufacturing suspended fin and gate-all-around field effect transistorINST OF MICROELECTRONICS CAS·Filed 2011·Granted Jan 29, 2013·25 cites·19 claims
- 1293US10643905B2IC unit and method of manufacturing the same, and electronic device including the sameINST OF MICROELECTRONICS CAS·Filed 2019·Granted May 5, 2020·5 cites·10 claims
- 1393US9583621B2Semiconductor device and method of manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2015·Granted Feb 28, 2017·9 cites·6 claims
- 1492US11532743B2Semiconductor device with U-shaped channel and manufacturing method thereof, and electronic apparatus including the sameINST OF MICROELECTRONICS CAS·Filed 2020·Granted Dec 20, 2022·2 cites·37 claims
- 1592US10750606B1Microwave plasma equipment and method of exciting plasmaINST OF MICROELECTRONICS CAS·Filed 2019·Granted Aug 18, 2020·14 cites·16 claims
- 1691US10115641B2Semiconductor arrangement, method of manufacturing the same electronic device including the sameINST OF MICROELECTRONICS CAS·Filed 2017·Granted Oct 30, 2018·6 cites·14 claims
- 1791US9780200B2Semiconductor arrangement for a FinFET and method for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2014·Granted Oct 3, 2017·11 cites·8 claims
- 1891US9735287B2Memory devices, methods of manufacturing the same, and methods of accessing the sameINST OF MICROELECTRONICS CAS·Filed 2013·Granted Aug 15, 2017·8 cites·24 claims
- 1991US9502560B2Semiconductor device and method of manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2015·Granted Nov 22, 2016·7 cites·6 claims
- 2090US9391073B2FinFET device and method for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2013·Granted Jul 12, 2016·13 cites·9 claims
- 2189US10978470B2Semiconductor device including multiple layers of memory cells, method of manufacturing the same, and electronic device including the sameINST OF MICROELECTRONICS CAS·Filed 2017·Granted Apr 13, 2021·5 cites·34 claims
- 2289US10700124B1Spin-orbit torque magnetoresistive random access memory and method for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2019·Granted Jun 30, 2020·5 cites·12 claims
- 2389US9892912B2Method of manufacturing stacked nanowire MOS transistorINST OF MICROELECTRONICS CAS·Filed 2015·Granted Feb 13, 2018·7 cites·10 claims
- 2489US9825135B2Semiconductor devices and methods for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2017·Granted Nov 21, 2017·4 cites·5 claims
- 2588US12477804B2NOR-type storage device, method of manufacturing the same, and electronic apparatus including storage deviceINST OF MICROELECTRONICS CAS·Filed 2022·Granted Nov 18, 2025·1 cites·20 claims
- 2688US11152516B2Nanometer semiconductor devices having high-quality epitaxial layerINST OF MICROELECTRONICS CAS·Filed 2019·Granted Oct 19, 2021·3 cites·14 claims
- 2787US12249544B2Semiconductor device, method of manufacturing the same and electronic device including the deviceINST OF MICROELECTRONICS CAS·Filed 2023·Granted Mar 11, 2025·0 cites·19 claims
- 2887US10797178B2Multi-gate FinFET including negative capacitor, method of manufacturing the same, and electronic deviceINST OF MICROELECTRONICS CAS·Filed 2018·Granted Oct 6, 2020·3 cites·17 claims
- 2987US10644020B2Three-dimensional semiconductor memory device with a substrate contact region and method of manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2015·Granted May 5, 2020·6 cites·13 claims
- 3087US8367558B2Method for tuning the work function of a metal gate of the PMOS deviceINST OF MICROELECTRONICS CAS·Filed 2010·Granted Feb 5, 2013·9 cites·10 claims
- 3186US11217493B2Semiconductor device, method of manufacturing the same and electronic device including the deviceINST OF MICROELECTRONICS CAS·Filed 2020·Granted Jan 4, 2022·1 cites·10 claims
- 3286US10833193B2Semiconductor device, method of manufacturing the same and electronic device including the deviceINST OF MICROELECTRONICS CAS·Filed 2017·Granted Nov 10, 2020·3 cites·44 claims
- 3386US8384162B2Device having adjustable channel stress and method thereofINST OF MICROELECTRONICS CAS·Filed 2011·Granted Feb 26, 2013·7 cites·11 claims
- 3485US12317511B2MRAM, method of manufacturing the same, and electronic device including the MRAMINST OF MICROELECTRONICS CAS·Filed 2021·Granted May 27, 2025·1 cites·22 claims
- 3585US11810823B2Semiconductor arrangements and methods for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2020·Granted Nov 7, 2023·1 cites·12 claims
- 3685US9397096B2Semiconductor device and method for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2012·Granted Jul 19, 2016·6 cites·14 claims
- 3785US9373622B2CMOS device with improved accuracy of threshold voltage adjustment and method for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2015·Granted Jun 21, 2016·5 cites·9 claims
- 3883US8936988B2Methods for manufacturing a MOSFET using a stress liner of diamond-like carbon on the substrateINST OF MICROELECTRONICS CAS·Filed 2014·Granted Jan 20, 2015·5 cites·14 claims
- 3982US9437609B2Vertical channel-type 3D semiconductor memory device and method for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2014·Granted Sep 6, 2016·4 cites·9 claims
- 4082US9324835B2Method for manufacturing MOSFETINST OF MICROELECTRONICS CAS·Filed 2012·Granted Apr 26, 2016·5 cites·14 claims
- 4181US11839085B2Three-dimensional vertical single transistor ferroelectric memory and manufacturing method thereofINST OF MICROELECTRONICS CAS·Filed 2019·Granted Dec 5, 2023·5 cites·16 claims
- 4281US11158547B2Semiconductor device, method of manufacturing the same, and electronic device including the deviceINST OF MICROELECTRONICS CAS·Filed 2017·Granted Oct 26, 2021·1 cites·36 claims
- 4381US10910278B2Semiconductor device, method of manufacturing the same and electronic device including the sameINST OF MICROELECTRONICS CAS·Filed 2017·Granted Feb 2, 2021·1 cites·30 claims
- 4481US9350380B2Sigma-delta modulator and analog-to-digital converterINST OF MICROELECTRONICS CAS·Filed 2013·Granted May 24, 2016·7 cites·18 claims
- 4580US9431504B2Semiconductor device and method for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2015·Granted Aug 30, 2016·4 cites·9 claims
- 4680US9385212B2Method for manufacturing semiconductor deviceINST OF MICROELECTRONICS CAS·Filed 2015·Granted Jul 5, 2016·3 cites·16 claims
- 4779US11830929B2Semiconductor device with spacer of gradually changed thickness and manufacturing method thereof, and electronic device including the semiconductor deviceINST OF MICROELECTRONICS CAS·Filed 2022·Granted Nov 28, 2023·0 cites·10 claims
- 4879US11728408B2Semiconductor device with spacer of gradually changed thickness and manufacturing method thereof, and electronic device including the semiconductor deviceINST OF MICROELECTRONICS CAS·Filed 2022·Granted Aug 15, 2023·0 cites·15 claims
- 4979US11373948B2Interconnection structure and method of manufacturing the same, and electronic device including the interconnection structureINST OF MICROELECTRONICS CAS·Filed 2018·Granted Jun 28, 2022·2 cites·19 claims
- 5079US9349867B2Semiconductor devices and methods for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2012·Granted May 24, 2016·4 cites·20 claims
Showing the top 50 of 440 patent records by PatentIndex Score.
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