Assignee
INSYSTEMS INC
US·5 granted patents·250 citations·filing 1985–1990
Top patents by PatentIndex Score
5 records- 0192US4806774AInspection system for array of microcircuit dies having redundant circuit patternsINSYSTEMS INC·Filed 1987·Granted Feb 21, 1989·140 cites·39 claims
- 0272US5172000ASpatial filter for optically based defect inspection systemINSYSTEMS INC·Filed 1990·Granted Dec 15, 1992·43 cites·17 claims
- 0371US4811409AMethod and apparatus for detecting defect information in a holographic image patternINSYSTEMS INC·Filed 1986·Granted Mar 7, 1989·32 cites·15 claims
- 0454US4712851APositioning alignment apparatus and method using holographic optical elementsINSYSTEMS INC·Filed 1986·Granted Dec 15, 1987·18 cites·18 claims
- 0554US4659172ARotatable and translatable mounting mechanism for a specimen pattern in optical processing apparatusINSYSTEMS INC·Filed 1985·Granted Apr 21, 1987·17 cites·10 claims
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