Assignee
INT PRECISION INC
JP·6 granted patents·93 citations·filing 1979–1983
Technology mixH01J6
Top patents by PatentIndex Score
6 records- 0185US4596934AElectron beam apparatus with improved specimen holderINT PRECISION INC·Filed 1983·Granted Jun 24, 1986·37 cites·7 claims
- 0283US4426577AElectron microscope of scanning typeINT PRECISION INC·Filed 1981·Granted Jan 17, 1984·26 cites·5 claims
- 0365US4316087AMethod of photographing electron microscope images on a single photographic plate and apparatus thereforINT PRECISION INC·Filed 1979·Granted Feb 16, 1982·12 cites·9 claims
- 0462US4434367AElectron microscopeINT PRECISION INC·Filed 1981·Granted Feb 28, 1984·10 cites·4 claims
- 0547US4429222ATransmission electron microscopeINT PRECISION INC·Filed 1981·Granted Jan 31, 1984·5 cites·2 claims
- 0636US4383176AObjective lens for electron microscopeINT PRECISION INC·Filed 1981·Granted May 10, 1983·3 cites·1 claims
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