Assignee
INTEGRATED SILICON SOLUTION SHANGHAI INC
CN·6 granted patents·14 citations·filing 2013–2018
Top patents by PatentIndex Score
6 records- 0169US9373417B2Circuit and method for testing memory devicesINTEGRATED SILICON SOLUTION SHANGHAI INC·Filed 2014·Granted Jun 21, 2016·6 cites·16 claims
- 0267US9287008B2Circuit and method for controlling internal test mode entry of an ASRAM chipINTEGRATED SILICON SOLUTION SHANGHAI INC·Filed 2013·Granted Mar 15, 2016·5 cites·10 claims
- 0355US9263141B2Methods for erasing, reading and programming flash memoriesINTEGRATED SILICON SOLUTION SHANGHAI INC·Filed 2014·Granted Feb 16, 2016·3 cites·10 claims
- 0432US10170597B2Method for forming flash memory unitINTEGRATED SILICON SOLUTION SHANGHAI INC·Filed 2018·Granted Jan 1, 2019·0 cites·10 claims
- 0532US9171609B2Address transition detecting circuitINTEGRATED SILICON SOLUTION SHANGHAI INC·Filed 2013·Granted Oct 27, 2015·0 cites·10 claims
- 0630US10008267B2Method for operating flash memoryINTEGRATED SILICON SOLUTION SHANGHAI INC·Filed 2017·Granted Jun 26, 2018·0 cites·10 claims
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