Assignee
INTELLITECH CORP
US·9 granted patents·1,900 citations·filing 1983–2005
Top patents by PatentIndex Score
9 records- 0197US6988232B2Method and apparatus for optimized parallel testing and access of electronic circuitsINTELLITECH CORP·Filed 2002·Granted Jan 17, 2006·182 cites·75 claims
- 0297US6594802B1Method and apparatus for providing optimized access to circuits for debug, programming, and testINTELLITECH CORP·Filed 2000·Granted Jul 15, 2003·143 cites·40 claims
- 0395US4827395AManufacturing monitoring and control systemsINTELLITECH CORP·Filed 1987·Granted May 2, 1989·568 cites·20 claims
- 0495US4656463ALIMIS systems, devices and methodsINTELLITECH CORP·Filed 1983·Granted Apr 7, 1987·831 cites·143 claims
- 0594US7574637B2Method and apparatus for optimized parallel testing and access of electronic circuitsINTELLITECH CORP·Filed 2005·Granted Aug 11, 2009·29 cites·34 claims
- 0691US6957371B2Method and apparatus for embedded built-in self-test (BIST) of electronic circuits and systemsINTELLITECH CORP·Filed 2002·Granted Oct 18, 2005·49 cites·83 claims
- 0788US7467342B2Method and apparatus for embedded built-in self-test (BIST) of electronic circuits and systemsINTELLITECH CORP·Filed 2005·Granted Dec 16, 2008·15 cites·85 claims
- 0881US5890899ADental isolatorINTELLITECH CORP·Filed 1997·Granted Apr 6, 1999·79 cites·13 claims
- 0947US7406638B2System and method for optimized test and configuration throughput of electronic circuitsINTELLITECH CORP·Filed 2004·Granted Jul 29, 2008·4 cites·8 claims
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