Assignee
ISEMICON INC
KR·1 granted patent·1 pending application·25 citations·filing 1999–2006
Top patents by PatentIndex Score
2 records- 0157US6714885B1Method for measuring number of yield loss chips and number of poor chips by type due to defect of semiconductor chipsISEMICON INC·Filed 1999·Granted Mar 30, 2004·25 cites·8 claims
- 0233US2008262771A1Statistic Analysis of Fault Detection and Classification in Semiconductor ManufacturingISEMICON INC·Filed 2006·Application pending·0 cites
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