Assignee
IWASAKI SHINYA
JP·5 granted patents·2 pending applications·25 citations·filing 2004–2014
Top patents by PatentIndex Score
7 records- 0186US8334193B2Method of manufacturing semiconductor deviceIWASAKI SHINYA·Filed 2011·Granted Dec 18, 2012·8 cites·6 claims
- 0285US10141304B2Semiconductor deviceIWASAKI SHINYA·Filed 2014·Granted Nov 27, 2018·7 cites·1 claims
- 0384US8742454B2Semiconductor deviceIWASAKI SHINYA·Filed 2013·Granted Jun 3, 2014·7 cites·4 claims
- 0471US8686467B2Semiconductor device comprising semiconductor substrate and having diode region and IGBT regionIWASAKI SHINYA·Filed 2012·Granted Apr 1, 2014·3 cites·10 claims
- 0546US9337058B2Method for reducing nonuniformity of forward voltage of semiconductor waferIWASAKI SHINYA·Filed 2013·Granted May 10, 2016·0 cites·8 claims
- 0644US2007131358A1Shutter curtain lifting prevention structure in shutter deviceIWASAKI SHINYA·Filed 2004·Application pending·0 cites
- 0741US2016027881A1Semiconductor device and method for manufacturing the sameIWASAKI SHINYA·Filed 2013·Application pending·0 cites
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