Assignee
IYENGAR VIKRAM
US·2 granted patents·1 pending application·0 citations·filing 2009–2012
Technology mixG01R3
Top patents by PatentIndex Score
3 records- 0137US8181135B2Hold transition fault model and test generation methodIYENGAR VIKRAM·Filed 2009·Granted May 15, 2012·0 cites·15 claims
- 0236US9043180B2Reducing power consumption during manufacturing test of an integrated circuitIYENGAR VIKRAM·Filed 2012·Granted May 26, 2015·0 cites·16 claims
- 0327US2012176144A1At-speed scan enable switching circuitIYENGAR VIKRAM·Filed 2011·Application pending·0 cites
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