Assignee

JAEHNKE TORSTEN

DE·1 granted patent·0 citations·filing 2008–2008

Technology mixB01L1 B82Y1 G01Q1

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0133US8505109B2Measuring probe device for a probe microscope, measuring cell and scanning probe microscopeJAEHNKE TORSTEN·Filed 2008·Granted Aug 6, 2013·0 cites·13 claims

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