Assignee
JENTEK SENSORS INC
US·74 granted patents·16 pending applications·1,666 citations·filing 1996–2025
Top patents by PatentIndex Score
90 records- 0197US6784662B2Eddy current sensor arrays having drive windings with extended portionsJENTEK SENSORS INC·Filed 2002·Granted Aug 31, 2004·94 cites·49 claims
- 0297US6657429B1Material condition assessment with spatially periodic field sensorsJENTEK SENSORS INC·Filed 2000·Granted Dec 2, 2003·116 cites·26 claims
- 0395US7528598B2Fastener and fitting based sensing methodsJENTEK SENSORS INC·Filed 2006·Granted May 5, 2009·27 cites·33 claims
- 0495US6995557B2High resolution inductive sensor arrays for material and defect characterization of weldsJENTEK SENSORS INC·Filed 2004·Granted Feb 7, 2006·64 cites·25 claims
- 0595US6952095B1Surface mounted and scanning spatially periodic eddy-current sensor arraysJENTEK SENSORS INC·Filed 2000·Granted Oct 4, 2005·61 cites·58 claims
- 0695US6727691B2High resolution inductive sensor arrays for material and defect characterization of weldsJENTEK SENSORS INC·Filed 2002·Granted Apr 27, 2004·67 cites·44 claims
- 0794US7451657B2Material condition monitoring with multiple sensing modesJENTEK SENSORS INC·Filed 2005·Granted Nov 18, 2008·29 cites·21 claims
- 0894US7230421B2Damage standard fabrication with attached sensorJENTEK SENSORS INC·Filed 2005·Granted Jun 12, 2007·26 cites·17 claims
- 0994US6992482B2Magnetic field sensor having a switchable drive current spatial distributionJENTEK SENSORS INC·Filed 2001·Granted Jan 31, 2006·44 cites·20 claims
- 1094US6380747B1Methods for processing, optimization, calibration and display of measured dielectrometry signals using property estimation gridsJENTEK SENSORS INC·Filed 1999·Granted Apr 30, 2002·94 cites·8 claims
- 1194US5793206AMeandering winding test circuitJENTEK SENSORS INC·Filed 1996·Granted Aug 11, 1998·136 cites·12 claims
- 1293US7467057B2Material property estimation using non-orthogonal responsive databasesJENTEK SENSORS INC·Filed 2005·Granted Dec 16, 2008·16 cites·14 claims
- 1392US7348771B2Method for verifying sensor conditionJENTEK SENSORS INC·Filed 2006·Granted Mar 25, 2008·16 cites·20 claims
- 1492US6351120B2Test circuit on flexible membrane with adhesiveJENTEK SENSORS INC·Filed 2000·Granted Feb 26, 2002·35 cites·6 claims
- 1591US12253492B2In-process quality assessment for additive manufacturingJENTEK SENSORS INC·Filed 2023·Granted Mar 18, 2025·0 cites·11 claims
- 1691US9255875B2Method and apparatus for inspection of corrosion and other defects through insulationJENTEK SENSORS INC·Filed 2012·Granted Feb 9, 2016·12 cites·20 claims
- 1791US7994781B2Eddy current sensor with concentric segmentsJENTEK SENSORS INC·Filed 2009·Granted Aug 9, 2011·14 cites·28 claims
- 1891US6188218B1Absolute property measurement with air calibrationJENTEK SENSORS INC·Filed 1998·Granted Feb 13, 2001·87 cites·44 claims
- 1990US10444189B2Method and apparatus for non-destructive evaluation of materialsJENTEK SENSORS INC·Filed 2017·Granted Oct 15, 2019·3 cites·6 claims
- 2090US7589526B2Surface mounted sensor arrays having segmented primary windingsJENTEK SENSORS INC·Filed 2007·Granted Sep 15, 2009·12 cites·17 claims
- 2189US8960012B2Method and apparatus for detection and characterization of mechanical damageJENTEK SENSORS INC·Filed 2013·Granted Feb 24, 2015·13 cites·20 claims
- 2289US7876094B2Magnetic field characterization of stresses and properties in materialsJENTEK SENSORS INC·Filed 2008·Granted Jan 25, 2011·9 cites·18 claims
- 2389US7049811B2Test circuit having parallel drive segments and a plurality of sense elementsJENTEK SENSORS INC·Filed 2004·Granted May 23, 2006·28 cites·28 claims
- 2488US7451639B2Engine blade dovetail inspectionJENTEK SENSORS INC·Filed 2007·Granted Nov 18, 2008·18 cites·23 claims
- 2588US7385392B2Eddy current sensing arrays and systemJENTEK SENSORS INC·Filed 2002·Granted Jun 10, 2008·33 cites·32 claims
- 2688US5966011AApparatus for measuring bulk materials and surface conditions for flat and curved partsJENTEK SENSORS INC·Filed 1998·Granted Oct 12, 1999·60 cites·12 claims
- 2787US7696748B2Absolute property measurements using electromagnetic sensorsJENTEK SENSORS INC·Filed 2004·Granted Apr 13, 2010·31 cites·18 claims
- 2887US7289913B2Local feature characterization using quasistatic electromagnetic sensorsJENTEK SENSORS INC·Filed 2005·Granted Oct 30, 2007·11 cites·14 claims
- 2987US6377039B1Method for characterizing coating and substratesJENTEK SENSORS INC·Filed 1998·Granted Apr 23, 2002·72 cites·43 claims
- 3086US8050883B2Material property estimation using inverse interpolationJENTEK SENSORS INC·Filed 2008·Granted Nov 1, 2011·9 cites·15 claims
- 3186US7518360B2Hybrid wound/etched winding constructs for scanning and monitoringJENTEK SENSORS INC·Filed 2007·Granted Apr 14, 2009·11 cites·30 claims
- 3285US11747304B2In-process quality assessment for additive manufacturingJENTEK SENSORS INC·Filed 2023·Granted Sep 5, 2023·0 cites·5 claims
- 3385US7280940B2Segmented field dielectric sensor array for material characterizationJENTEK SENSORS INC·Filed 2006·Granted Oct 9, 2007·9 cites·28 claims
- 3485US6486673B1Segmented field dielectrometerJENTEK SENSORS INC·Filed 2000·Granted Nov 26, 2002·57 cites·19 claims
- 3584US7188532B2Self-monitoring metals, alloys and materialsJENTEK SENSORS INC·Filed 2004·Granted Mar 13, 2007·20 cites·13 claims
- 3683US10324062B2Method and apparatus for measurement of material conditionJENTEK SENSORS INC·Filed 2014·Granted Jun 18, 2019·4 cites·4 claims
- 3783US7106055B2Fabrication of samples having predetermined material conditionsJENTEK SENSORS INC·Filed 2004·Granted Sep 12, 2006·20 cites·40 claims
- 3883US2025224374A1In-Process Quality Assessment for Additive ManufacturingJENTEK SENSORS INC·Filed 2025·Application pending·0 cites
- 3982US11543388B2In-process quality assessment for additive manufacturingJENTEK SENSORS INC·Filed 2022·Granted Jan 3, 2023·0 cites·20 claims
- 4082US10732096B2Method and apparatus for inspection of corrosion and other defects through insulationJENTEK SENSORS INC·Filed 2017·Granted Aug 4, 2020·2 cites·20 claims
- 4182US7183764B2Method for inspecting a channel using a flexible sensorJENTEK SENSORS INC·Filed 2003·Granted Feb 27, 2007·20 cites·14 claims
- 4281US7161350B2Method for material property monitoring with perforated, surface mounted sensorsJENTEK SENSORS INC·Filed 2003·Granted Jan 9, 2007·16 cites·6 claims
- 4381US2025044257A1System and method for hole inspectionJENTEK SENSORS INC·Filed 2024·Application pending·0 cites
- 4480US7161351B2Hidden feature characterization using a database of sensor responsesJENTEK SENSORS INC·Filed 2004·Granted Jan 9, 2007·16 cites·29 claims
- 4580US6781387B2Inspection method using penetrant and dielectrometerJENTEK SENSORS INC·Filed 2002·Granted Aug 24, 2004·44 cites·4 claims
- 4679US12359945B2Measurement system and method of useJENTEK SENSORS INC·Filed 2023·Granted Jul 15, 2025·0 cites·20 claims
- 4779US6420867B1Method of detecting widespread fatigue and cracks in a metal structureJENTEK SENSORS INC·Filed 1998·Granted Jul 16, 2002·52 cites·23 claims
- 4878US6798198B2Fluid supports for sensorsJENTEK SENSORS INC·Filed 2003·Granted Sep 28, 2004·13 cites·31 claims
- 4977US12061169B2System and method for hole inspectionJENTEK SENSORS INC·Filed 2022·Granted Aug 13, 2024·0 cites·20 claims
- 5077US7526964B2Applied and residual stress measurements using magnetic field sensorsJENTEK SENSORS INC·Filed 2003·Granted May 5, 2009·19 cites·23 claims
Showing the top 50 of 90 patent records by PatentIndex Score.
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