Assignee
JEOL LTD
JP·790 granted patents·130 pending applications·7,867 citations·filing 1973–2025
Top patents by PatentIndex Score
920 records- 0197US7504620B2Method and apparatus for time-of-flight mass spectrometryJEOL LTD·Filed 2005·Granted Mar 17, 2009·41 cites·9 claims
- 0296US10908239B1Broad band inductive matching of a nuclear magnetic resonance circuit using inductive couplingJEOL LTD·Filed 2020·Granted Feb 2, 2021·8 cites·20 claims
- 0396US4045672AApparatus for tomography comprising a pin hole for forming a microbeam of x-raysJEOL LTD·Filed 1976·Granted Aug 30, 1977·83 cites·14 claims
- 0495US12422508B1Sliding band capacitor inductive coupling in a low temperature nuclear magnetic resonance probe and methods of useJEOL LTD·Filed 2024·Granted Sep 23, 2025·2 cites·16 claims
- 0595US6310762B1Carbon material for electric double layer capacitor, method of producing same, electric double layer capacitor and method of fabricating sameJEOL LTD·Filed 1999·Granted Oct 30, 2001·122 cites·10 claims
- 0695US5783928AStorage capacitor power supplyJEOL LTD·Filed 1993·Granted Jul 21, 1998·101 cites·4 claims
- 0794US6504365B2Magnetic force microscopeJEOL LTD·Filed 2001·Granted Jan 7, 2003·69 cites·6 claims
- 0894US6426501B1Defect-review SEM, reference sample for adjustment thereof, method for adjustment thereof, and method of inspecting contact holesJEOL LTD·Filed 1999·Granted Jul 30, 2002·105 cites·16 claims
- 0994US4419581AMagnetic objective lens for use in a scanning electron microscopeJEOL LTD·Filed 1982·Granted Dec 6, 1983·55 cites·3 claims
- 1093US11668662B2Sample analysis apparatus and methodJEOL LTD·Filed 2021·Granted Jun 6, 2023·2 cites·12 claims
- 1193US10241165B2Inductive coupling in multiple resonance circuits in a nuclear magnetic resonance probe and methods of useJEOL LTD·Filed 2017·Granted Mar 26, 2019·5 cites·17 claims
- 1293US7755036B2Instrument and method for tandem time-of-flight mass spectrometryJEOL LTD·Filed 2008·Granted Jul 13, 2010·33 cites·19 claims
- 1393US6300625B1Time-of-flight mass spectrometerJEOL LTD·Filed 1998·Granted Oct 9, 2001·80 cites·8 claims
- 1493US5713426AHybrid vehicleJEOL LTD·Filed 1996·Granted Feb 3, 1998·126 cites·17 claims
- 1593US4681513ATwo-stage pump assemblyJEOL LTD·Filed 1986·Granted Jul 21, 1987·96 cites·5 claims
- 1692US11837437B2Specimen machining device and information provision methodJEOL LTD·Filed 2022·Granted Dec 5, 2023·2 cites·9 claims
- 1792US10241063B2Magnetic coupling high resolution nuclear magnetic resolution probe and method of useJEOL LTD·Filed 2016·Granted Mar 26, 2019·5 cites·20 claims
- 1892US9452489B2Machine and method for additive manufacturingJEOL LTD·Filed 2015·Granted Sep 27, 2016·5 cites·5 claims
- 1992US6738252B2Carbon material for electric double layer capacitor, method of producing same, electric double layer capacitor and method of fabricating sameJEOL LTD·Filed 2001·Granted May 18, 2004·54 cites·4 claims
- 2092US5225683ADetachable specimen holder for transmission electron microscopeJEOL LTD·Filed 1991·Granted Jul 6, 1993·87 cites·9 claims
- 2191US11726152B1Solid sample magnetic coupling high resolution nuclear magnetic resolution probe and method of useJEOL LTD·Filed 2022·Granted Aug 15, 2023·1 cites·20 claims
- 2291US11133151B2Transmission electron microscope and method of controlling sameJEOL LTD·Filed 2020·Granted Sep 28, 2021·3 cites·4 claims
- 2391US7923700B2Sample inspection apparatus, sample inspection method and sample inspection systemJEOL LTD·Filed 2007·Granted Apr 12, 2011·13 cites·25 claims
- 2491US7745802B2Specimen holder, specimen inspection apparatus, specimen inspection method, and method of fabricating specimen holderJEOL LTD·Filed 2008·Granted Jun 29, 2010·16 cites·25 claims
- 2591US6949736B2Method of multi-turn time-of-flight mass analysisJEOL LTD·Filed 2004·Granted Sep 27, 2005·39 cites·8 claims
- 2690US11776787B2Charged particle beam apparatusJEOL LTD·Filed 2022·Granted Oct 3, 2023·2 cites·8 claims
- 2790US10656107B2Magnetic coupling high resolution nuclear magnetic resolution probe and method of useJEOL LTD·Filed 2019·Granted May 19, 2020·3 cites·21 claims
- 2890US10620282B2Inductive coupling in multiple resonance circuits in a nuclear magnetic resonance probe and methods of useJEOL LTD·Filed 2018·Granted Apr 14, 2020·3 cites·20 claims
- 2990US7864922B2Wavelength-dispersive X-ray spectrometerJEOL LTD·Filed 2006·Granted Jan 4, 2011·47 cites·9 claims
- 3090US6744048B2Lens system for phase plate for transmission electron microscope and transmission electron microscopeJEOL LTD·Filed 2002·Granted Jun 1, 2004·40 cites·4 claims
- 3190US6259960B1Part-inspecting systemJEOL LTD·Filed 1997·Granted Jul 10, 2001·240 cites·39 claims
- 3290US4992660AScanning tunneling microscopeJEOL LTD·Filed 1990·Granted Feb 12, 1991·91 cites·5 claims
- 3390US4912326ADirect imaging type SIMS instrumentJEOL LTD·Filed 1988·Granted Mar 27, 1990·62 cites·2 claims
- 3489US11609191B2AnalyzerJEOL LTD·Filed 2020·Granted Mar 21, 2023·2 cites·8 claims
- 3589US7230234B2Orthogonal acceleration time-of-flight mass spectrometerJEOL LTD·Filed 2005·Granted Jun 12, 2007·16 cites·10 claims
- 3689US7060986B2Automated method of correcting aberrations in electron beam, method of visualizing aberrations, and automated aberration correctorJEOL LTD·Filed 2005·Granted Jun 13, 2006·20 cites·7 claims
- 3789US6914430B2NMR probeJEOL LTD·Filed 2004·Granted Jul 5, 2005·66 cites·10 claims
- 3889US6721168B2Electric double-layer capacitor and carbon material thereforJEOL LTD·Filed 2001·Granted Apr 13, 2004·58 cites·6 claims
- 3989US6146592AAutomatic biochemical analyzerJEOL LTD·Filed 1997·Granted Nov 14, 2000·121 cites·8 claims
- 4089US5907157AMethod and apparatus for preparing specimenJEOL LTD·Filed 1997·Granted May 25, 1999·100 cites·18 claims
- 4189US4442355ADevice for detecting secondary electrons in a scanning electron microscopeJEOL LTD·Filed 1981·Granted Apr 10, 1984·42 cites·6 claims
- 4289US4068123AScanning electron microscopeJEOL LTD·Filed 1974·Granted Jan 10, 1978·38 cites·3 claims
- 4388US12261013B2Charged particle beam system and control method thereforJEOL LTD·Filed 2022·Granted Mar 25, 2025·2 cites·4 claims
- 4488US11499927B2Analysis method and X-ray fluorescence analyzerJEOL LTD·Filed 2021·Granted Nov 15, 2022·2 cites·8 claims
- 4588US10132761B2Method of constructing 3D image, image processor, and electron microscopeJEOL LTD·Filed 2015·Granted Nov 20, 2018·5 cites·7 claims
- 4688US7745785B2Sample inspection method, sample inspection apparatus, and sample holderJEOL LTD·Filed 2007·Granted Jun 29, 2010·12 cites·18 claims
- 4788US6924488B2Charged-particle beam apparatus equipped with aberration correctorJEOL LTD·Filed 2003·Granted Aug 2, 2005·33 cites·15 claims
- 4888US3952198AElectron lensJEOL LTD·Filed 1974·Granted Apr 20, 1976·29 cites·3 claims
- 4988US3937959AMethod and apparatus for automatically focusingJEOL LTD·Filed 1974·Granted Feb 10, 1976·29 cites·10 claims
- 5087US10935505B2Scanning electron microscope and method for determining crystal orientationsJEOL LTD·Filed 2018·Granted Mar 2, 2021·4 cites·13 claims
Showing the top 50 of 920 patent records by PatentIndex Score.
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