Assignee
JIANG XINRONG
US·4 granted patents·133 citations·filing 2011–2012
Top patents by PatentIndex Score
4 records- 0196US8664594B1Electron-optical system for high-speed and high-sensitivity inspectionsJIANG XINRONG·Filed 2011·Granted Mar 4, 2014·120 cites·9 claims
- 0283US8859982B2Dual-lens-gun electron beam apparatus and methods for high-resolution imaging with both high and low beam currentsJIANG XINRONG·Filed 2012·Granted Oct 14, 2014·6 cites·7 claims
- 0376US8536538B2Multiple-pole electrostatic deflector for improving throughput of focused electron beam instrumentsJIANG XINRONG·Filed 2011·Granted Sep 17, 2013·4 cites·3 claims
- 0473US9053900B2Apparatus and methods for high-resolution electron beam imagingJIANG XINRONG·Filed 2012·Granted Jun 9, 2015·3 cites·13 claims
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