Assignee
JNK TECH
US·7 granted patents·1 pending application·19 citations·filing 2021–2025
Top patents by PatentIndex Score
8 records- 0195US11508590B2Substrate inspection system and method of use thereofJNK TECH·Filed 2022·Granted Nov 22, 2022·5 cites·21 claims
- 0295US11286567B1Glass and wafer inspection system and a method of use thereofJNK TECH·Filed 2021·Granted Mar 29, 2022·8 cites·20 claims
- 0393US11901202B2Substrate inspection system and method of use thereofJNK TECH·Filed 2022·Granted Feb 13, 2024·2 cites·20 claims
- 0492US11840762B2Substrate inspection system and a method of use thereofJNK TECH·Filed 2022·Granted Dec 12, 2023·2 cites·23 claims
- 0591US11987884B2Glass and wafer inspection system and a method of use thereofJNK TECH·Filed 2021·Granted May 21, 2024·2 cites·4 claims
- 0681US12322616B2Substrate inspection system and method of use thereofJNK TECH·Filed 2024·Granted Jun 3, 2025·0 cites·9 claims
- 0781US12258665B2Substrate inspection system and a method of use thereofJNK TECH·Filed 2023·Granted Mar 25, 2025·0 cites·3 claims
- 0881US2026090320A1Substrate inspection system and method of use thereofJNK TECH·Filed 2025·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →