Assignee
JORDAN VALLEY SEMICONDUCTORS
IL·20 granted patents·1 pending application·427 citations·filing 2004–2014
Top patents by PatentIndex Score
21 records- 0198US7551719B2Multifunction X-ray analysis systemJORDAN VALLEY SEMICONDUCTORS·Filed 2005·Granted Jun 23, 2009·120 cites·36 claims
- 0297US7406153B2Control of X-ray beam spot sizeJORDAN VALLEY SEMICONDUCTORS·Filed 2006·Granted Jul 29, 2008·57 cites·26 claims
- 0396US8054453B2Broad band referencing reflectometerJORDAN VALLEY SEMICONDUCTORS·Filed 2010·Granted Nov 8, 2011·15 cites·20 claims
- 0495US7680243B2X-ray measurement of properties of nano-particlesJORDAN VALLEY SEMICONDUCTORS·Filed 2007·Granted Mar 16, 2010·55 cites·16 claims
- 0595US7483513B2Measurement of properties of thin films on sidewallsJORDAN VALLEY SEMICONDUCTORS·Filed 2006·Granted Jan 27, 2009·26 cites·40 claims
- 0693US7653174B2Inspection of small features using X-ray fluorescenceJORDAN VALLEY SEMICONDUCTORS·Filed 2007·Granted Jan 26, 2010·29 cites·12 claims
- 0792US7990549B2Method and apparatus for optically measuring periodic structures using orthogonal azimuthal sample orientationJORDAN VALLEY SEMICONDUCTORS·Filed 2009·Granted Aug 2, 2011·17 cites·18 claims
- 0892US7600916B2Target alignment for X-ray scattering measurementsJORDAN VALLEY SEMICONDUCTORS·Filed 2007·Granted Oct 13, 2009·21 cites·20 claims
- 0990US9269468B2X-ray beam conditioningJORDAN VALLEY SEMICONDUCTORS·Filed 2013·Granted Feb 23, 2016·11 cites·9 claims
- 1083US7453985B2Control of X-ray beam spot sizeJORDAN VALLEY SEMICONDUCTORS·Filed 2007·Granted Nov 18, 2008·7 cites·17 claims
- 1181US7649978B2Automated selection of X-ray reflectometry measurement locationsJORDAN VALLEY SEMICONDUCTORS·Filed 2008·Granted Jan 19, 2010·7 cites·20 claims
- 1281US7415096B2Curved X-ray reflectorJORDAN VALLEY SEMICONDUCTORS·Filed 2006·Granted Aug 19, 2008·30 cites·15 claims
- 1378US7948631B2Method and apparatus for using multiple relative reflectance measurements to determine properties of a sample using vacuum ultra violet wavelengthsJORDAN VALLEY SEMICONDUCTORS·Filed 2009·Granted May 24, 2011·4 cites·39 claims
- 1477US7804059B2Method and apparatus for accurate calibration of VUV reflectometerJORDAN VALLEY SEMICONDUCTORS·Filed 2004·Granted Sep 28, 2010·12 cites·30 claims
- 1576US9389192B2Estimation of XRF intensity from an array of micro-bumpsJORDAN VALLEY SEMICONDUCTORS·Filed 2014·Granted Jul 12, 2016·2 cites·17 claims
- 1675US7321652B2Multi-detector EDXRDJORDAN VALLEY SEMICONDUCTORS·Filed 2006·Granted Jan 22, 2008·4 cites·16 claims
- 1774US8693635B2X-ray detector assembly with shieldJORDAN VALLEY SEMICONDUCTORS·Filed 2013·Granted Apr 8, 2014·2 cites·11 claims
- 1873US8014000B2Broad band referencing reflectometerJORDAN VALLEY SEMICONDUCTORS·Filed 2009·Granted Sep 6, 2011·3 cites·20 claims
- 1973US7804934B2Accurate measurement of layer dimensions using XRFJORDAN VALLEY SEMICONDUCTORS·Filed 2008·Granted Sep 28, 2010·5 cites·18 claims
- 2047US2010277741A1Combined optical metrology techniquesJORDAN VALLEY SEMICONDUCTORS·Filed 2010·Application pending·0 cites
- 2143US9390984B2X-ray inspection of bumps on a semiconductor substrateJORDAN VALLEY SEMICONDUCTORS·Filed 2012·Granted Jul 12, 2016·0 cites·14 claims
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