Assignee
JORDAN VALLEY SEMICONDUCTORS LTD
IL·7 granted patents·78 citations·filing 2014–2015
Top patents by PatentIndex Score
7 records- 0196US9551677B2Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)JORDAN VALLEY SEMICONDUCTORS LTD·Filed 2014·Granted Jan 24, 2017·26 cites·20 claims
- 0294US9606073B2X-ray scatterometry apparatusJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Mar 28, 2017·17 cites·20 claims
- 0392US9748070B1X-ray tube anodeJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Aug 29, 2017·11 cites·16 claims
- 0492US9726624B2Using multiple sources/detectors for high-throughput X-ray topography measurementJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Aug 8, 2017·7 cites·14 claims
- 0591US9829448B2Measurement of small features using XRFJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Nov 28, 2017·8 cites·20 claims
- 0682US9632043B2Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRFJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Apr 25, 2017·7 cites·20 claims
- 0762US9666322B2X-ray source assemblyJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2014·Granted May 30, 2017·2 cites·16 claims
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