Assignee
KAMATA TATSUO
JP·1 granted patent·1 pending application·0 citations·filing 2008–2008
Top patents by PatentIndex Score
2 records- 0156US2010200432A1Method and apparatus for determining substrate concentration and reagent for determining substrate concentrationKAMATA TATSUO·Filed 2008·Application pending·0 cites
- 0241US8535510B2Method for measuring substrate concentration and apparatus for measuring substrate concentrationKAMATA TATSUO·Filed 2008·Granted Sep 17, 2013·0 cites·11 claims
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