Assignee
KAMBA SEIJI
JP·2 granted patents·5 citations·filing 2011–2012
Technology mixG01N2
Top patents by PatentIndex Score
2 records- 0180US8304732B2Method of measuring characteristics of specimen and flat-plate periodic structureKAMBA SEIJI·Filed 2012·Granted Nov 6, 2012·5 cites·18 claims
- 0246US8269967B2Method for measuring characteristic of object to be measured, structure causing diffraction phenomenon, and measuring deviceKAMBA SEIJI·Filed 2011·Granted Sep 18, 2012·0 cites·21 claims
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