Assignee
KAMEDA YOSHIO
JP·4 granted patents·1 pending application·2 citations·filing 2009–2010
Top patents by PatentIndex Score
5 records- 0158US8862934B2Redundant computing system and redundant computing methodKAMEDA YOSHIO·Filed 2010·Granted Oct 14, 2014·1 cites·18 claims
- 0249US8513970B2Semiconductor device and method of testing the sameKAMEDA YOSHIO·Filed 2009·Granted Aug 20, 2013·1 cites·18 claims
- 0341US8536890B2Semiconductor inspecting device and semiconductor inspecting methodKAMEDA YOSHIO·Filed 2009·Granted Sep 17, 2013·0 cites·21 claims
- 0440US8570056B2Semiconductor inspection apparatus, semiconductor wafer positioning method, and semiconductor wafer inspection methodKAMEDA YOSHIO·Filed 2009·Granted Oct 29, 2013·0 cites·16 claims
- 0538US2012307650A1Multiplex systemKAMEDA YOSHIO·Filed 2010·Application pending·0 cites
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