Assignee
KANEKO HITOMI
JP·6 granted patents·1 pending application·22 citations·filing 2012–2018
Top patents by PatentIndex Score
7 records- 0189US10657635B2Inspection apparatus, inspection method and storage mediumKANEKO HITOMI·Filed 2018·Granted May 19, 2020·10 cites·8 claims
- 0283US9064297B2Image inspection apparatus, image inspection system and image inspection methodKANEKO HITOMI·Filed 2013·Granted Jun 23, 2015·6 cites·8 claims
- 0377US11094054B2Inspection apparatus, inspection system, and inspection methodKANEKO HITOMI·Filed 2018·Granted Aug 17, 2021·1 cites·19 claims
- 0474US8848244B2Image inspection method, apparatus, control program overlapping inspection images to obtain positional shiftKANEKO HITOMI·Filed 2013·Granted Sep 30, 2014·4 cites·16 claims
- 0564US9233551B2Apparatus, system, and method of inspecting image, and recording medium storing image inspection control programKANEKO HITOMI·Filed 2012·Granted Jan 12, 2016·1 cites·13 claims
- 0639US10019792B2Examination device, examination method, and computer program productKANEKO HITOMI·Filed 2017·Granted Jul 10, 2018·0 cites·15 claims
- 0733US2015243010A1Image inspection device, image inspection system, and recording medium storing image inspection programKANEKO HITOMI·Filed 2015·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →