Assignee
KAWASAKI MICROELECTRONICS INC
JP·96 granted patents·25 pending applications·2,109 citations·filing 1998–2013
Top patents by PatentIndex Score
121 records- 0197US7137092B2Layout method of semiconductor integrated circuit, layout structure thereof, and photomask for forming the layout structureKAWASAKI MICROELECTRONICS INC·Filed 2004·Granted Nov 14, 2006·350 cites·28 claims
- 0296US6437441B1Wiring structure of a semiconductor integrated circuit and a method of forming the wiring structureKAWASAKI MICROELECTRONICS INC·Filed 1998·Granted Aug 20, 2002·162 cites·12 claims
- 0395US6370603B1Configurable universal serial bus (USB) controller implemented on a single integrated circuit (IC) chip with media access control (MAC)KAWASAKI MICROELECTRONICS INC·Filed 1998·Granted Apr 9, 2002·320 cites·32 claims
- 0492US6978319B1Plug-and-play cable with protocol translationKAWASAKI MICROELECTRONICS INC·Filed 2000·Granted Dec 20, 2005·76 cites·22 claims
- 0591US7629689B2Semiconductor integrated circuit having connection pads over active elementsKAWASAKI MICROELECTRONICS INC·Filed 2005·Granted Dec 8, 2009·26 cites·17 claims
- 0689US6797634B2Method of conditioning an etching chamber and method of processing semiconductor substrate using the etching chamberKAWASAKI MICROELECTRONICS INC·Filed 2002·Granted Sep 28, 2004·44 cites·38 claims
- 0789US6558505B2Method and apparatus for processing semiconductor substratesKAWASAKI MICROELECTRONICS INC·Filed 2002·Granted May 6, 2003·41 cites·18 claims
- 0888US6625662B1Inter-network connecting deviceKAWASAKI MICROELECTRONICS INC·Filed 2000·Granted Sep 23, 2003·61 cites·9 claims
- 0987US7691277B2Quartz component for plasma processing apparatus and restoring method thereofKAWASAKI MICROELECTRONICS INC·Filed 2008·Granted Apr 6, 2010·9 cites·16 claims
- 1087US6933973B1CMOS image sensor having block scanning capabilityKAWASAKI MICROELECTRONICS INC·Filed 2000·Granted Aug 23, 2005·32 cites·12 claims
- 1187US6810434B2Multimedia interface having a processor and reconfigurable logicKAWASAKI MICROELECTRONICS INC·Filed 2001·Granted Oct 26, 2004·55 cites·28 claims
- 1287US6614208B2Soft switching DC-to-DC converter and controlling method thereofKAWASAKI MICROELECTRONICS INC·Filed 2001·Granted Sep 2, 2003·67 cites·15 claims
- 1386US7420395B2Output buffer circuit and system including the output buffer circuitKAWASAKI MICROELECTRONICS INC·Filed 2007·Granted Sep 2, 2008·35 cites·10 claims
- 1486US6825722B2Mixer and differential amplifier having bandpass frequency selectivityKAWASAKI MICROELECTRONICS INC·Filed 2003·Granted Nov 30, 2004·35 cites·9 claims
- 1583US6707692B2Content addressable memory device capable of being used as binary CAM device or as ternary CAM device and structure method thereforKAWASAKI MICROELECTRONICS INC·Filed 2002·Granted Mar 16, 2004·36 cites·14 claims
- 1682US7307554B2Parallel data transmission method and parallel data transmission systemKAWASAKI MICROELECTRONICS INC·Filed 2005·Granted Dec 11, 2007·10 cites·24 claims
- 1782US6836133B2Test circuit, semiconductor product wafer having the test circuit, and method of monitoring manufacturing process using the test circuitKAWASAKI MICROELECTRONICS INC·Filed 2002·Granted Dec 28, 2004·23 cites·17 claims
- 1881US7257790B2Layout structure of semiconductor integrated circuit and method for forming the sameKAWASAKI MICROELECTRONICS INC·Filed 2004·Granted Aug 14, 2007·20 cites·28 claims
- 1980US7567484B2Method of preventing dielectric breakdown of semiconductor device and semiconductor device preventing dielectric breakdownKAWASAKI MICROELECTRONICS INC·Filed 2007·Granted Jul 28, 2009·11 cites·6 claims
- 2080US6924656B2Method and apparatus for testing BGA-type semiconductor devicesKAWASAKI MICROELECTRONICS INC·Filed 2003·Granted Aug 2, 2005·33 cites·10 claims
- 2180US6815771B2Silicon on insulator device and layout method of the sameKAWASAKI MICROELECTRONICS INC·Filed 2002·Granted Nov 9, 2004·23 cites·19 claims
- 2278US7469389B2Standard cell library, method of designing semiconductor integrated circuit, semiconductor integrated circuit pattern, and semiconductor integrated circuitKAWASAKI MICROELECTRONICS INC·Filed 2006·Granted Dec 23, 2008·15 cites·34 claims
- 2378US7301797B2Method of operating semiconductor integrated circuit including SRAM block and semiconductor integrated circuit including SRAM blockKAWASAKI MICROELECTRONICS INC·Filed 2005·Granted Nov 27, 2007·11 cites·15 claims
- 2477US7834889B2Data conversion circuit having look-up table and interpolation circuit and method of data conversionKAWASAKI MICROELECTRONICS INC·Filed 2005·Granted Nov 16, 2010·5 cites·20 claims
- 2577US7649393B2Semiconductor integrated circuit having active and sleep modes and non-retention flip-flop that is initialized when switching from sleep mode to active modeKAWASAKI MICROELECTRONICS INC·Filed 2008·Granted Jan 19, 2010·19 cites·23 claims
- 2677US7403195B2Method and apparatus for driving passive matrix liquid crystalKAWASAKI MICROELECTRONICS INC·Filed 2005·Granted Jul 22, 2008·3 cites·10 claims
- 2777US6547921B2Method and apparatus for processing semiconductor substratesKAWASAKI MICROELECTRONICS INC·Filed 2002·Granted Apr 15, 2003·17 cites·41 claims
- 2876US7586380B1Bias circuit to stabilize oscillation in ring oscillator, oscillator, and method to stabilize oscillation in ring oscillatorKAWASAKI MICROELECTRONICS INC·Filed 2008·Granted Sep 8, 2009·18 cites·21 claims
- 2976US6646900B2Ternary content addressable memory with data and mask data settable therewithin by one write cycleKAWASAKI MICROELECTRONICS INC·Filed 2002·Granted Nov 11, 2003·28 cites·19 claims
- 3076US6507376B2Display device formed on semiconductor substrate and display system using the sameKAWASAKI MICROELECTRONICS INC·Filed 2001·Granted Jan 14, 2003·17 cites·25 claims
- 3176US6447853B1Method and apparatus for processing semiconductor substratesKAWASAKI MICROELECTRONICS INC·Filed 1999·Granted Sep 10, 2002·39 cites·20 claims
- 3275US7557428B2Semiconductor integrated circuit having a reduced parasitic capacitance and short start-up timeKAWASAKI MICROELECTRONICS INC·Filed 2006·Granted Jul 7, 2009·10 cites·2 claims
- 3374US6897161B2Method of cleaning component in plasma processing chamber and method of producing semiconductor devicesKAWASAKI MICROELECTRONICS INC·Filed 2003·Granted May 24, 2005·16 cites·27 claims
- 3474US6560147B2Semiconductor device having scan test circuit that switches clock signal between shift mode and capture mode, and method of testing the semiconductor deviceKAWASAKI MICROELECTRONICS INC·Filed 2002·Granted May 6, 2003·23 cites·13 claims
- 3573US7030027B1Etching methods and apparatus for producing semiconductor devicesKAWASAKI MICROELECTRONICS INC·Filed 2000·Granted Apr 18, 2006·15 cites·34 claims
- 3672US7432115B2Test circuit, semiconductor product wafer having the test circuit, and method of monitoring manufacturing process using the test circuitKAWASAKI MICROELECTRONICS INC·Filed 2007·Granted Oct 7, 2008·3 cites·6 claims
- 3772US6522175B2Current/voltage converter and D/A converterKAWASAKI MICROELECTRONICS INC·Filed 2001·Granted Feb 18, 2003·23 cites·30 claims
- 3871US7921397B2Method of designing semiconductor integrated circuits, and semiconductor integrated circuits that allow precise adjustment of delay timeKAWASAKI MICROELECTRONICS INC·Filed 2007·Granted Apr 5, 2011·6 cites·19 claims
- 3971US7171636B2Pass-transistor logic circuit and a method of designing thereofKAWASAKI MICROELECTRONICS INC·Filed 2003·Granted Jan 30, 2007·10 cites·11 claims
- 4071US7124334B2Test circuit and test method for communication systemKAWASAKI MICROELECTRONICS INC·Filed 2003·Granted Oct 17, 2006·23 cites·20 claims
- 4171US7002252B2Wiring structure of a semiconductor integrated circuit and a method of forming the wiring structureKAWASAKI MICROELECTRONICS INC·Filed 2002·Granted Feb 21, 2006·13 cites·43 claims
- 4270US6985097B2Error correction circuit and A/D converterKAWASAKI MICROELECTRONICS INC·Filed 2005·Granted Jan 10, 2006·7 cites·5 claims
- 4370US6779046B1Serial-data transfer system which has a normal mode and a local mode and devices for the sameKAWASAKI MICROELECTRONICS INC·Filed 2000·Granted Aug 17, 2004·32 cites·16 claims
- 4470US6492189B1Method of arranging exposed areas including a limited number of test element group (TEG) regions on a semiconductor waferKAWASAKI MICROELECTRONICS INC·Filed 2000·Granted Dec 10, 2002·14 cites·19 claims
- 4569US7061293B2Spread spectrum clock generating circuitKAWASAKI MICROELECTRONICS INC·Filed 2004·Granted Jun 13, 2006·14 cites·18 claims
- 4668US8006156B2Method of generating test condition for detecting delay faults in semiconductor integrated circuit and apparatus for generating the sameKAWASAKI MICROELECTRONICS INC·Filed 2009·Granted Aug 23, 2011·8 cites·17 claims
- 4768US7220649B2Method of manufacturing semiconductor device and the semiconductor device manufactured by the methodKAWASAKI MICROELECTRONICS INC·Filed 2005·Granted May 22, 2007·3 cites·6 claims
- 4868US6457001B1Method and apparatus for data retrievalKAWASAKI MICROELECTRONICS INC·Filed 1999·Granted Sep 24, 2002·44 cites·9 claims
- 4967US6842359B2Content addressable memory device having an operation mode setting meansKAWASAKI MICROELECTRONICS INC·Filed 2003·Granted Jan 11, 2005·15 cites·17 claims
- 5063US6797554B2Method of manufacturing semiconductor integrated circuit having capacitor and silicided and non-silicided transistorsKAWASAKI MICROELECTRONICS INC·Filed 2002·Granted Sep 28, 2004·11 cites·7 claims
Showing the top 50 of 121 patent records by PatentIndex Score.
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