Assignee
KHURANA NEERAJ
US·2 granted patents·9 citations·filing 2008–2011
Top patents by PatentIndex Score
2 records- 0172US8072589B2System and method for photoemission-based defect detectionKHURANA NEERAJ·Filed 2008·Granted Dec 6, 2011·7 cites·25 claims
- 0263US9390486B2System and method for automatic orientation of a chip to the CAD layout with sub-optical resolutionKHURANA NEERAJ·Filed 2011·Granted Jul 12, 2016·2 cites·16 claims
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