Assignee
KIJIMA MIHOKO
JP·2 granted patents·4 citations·filing 2008–2009
Top patents by PatentIndex Score
2 records- 0165US8581187B2Method for measuring sample and measurement deviceKIJIMA MIHOKO·Filed 2009·Granted Nov 12, 2013·3 cites·13 claims
- 0253US8788981B2Method of OPC model building, information-processing apparatus, and method of determining process conditions of semiconductor deviceKIJIMA MIHOKO·Filed 2008·Granted Jul 22, 2014·1 cites·7 claims
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