Assignee
KING YUAN ELECTRONICS CO LTD
TW·34 granted patents·13 pending applications·66 citations·filing 2005–2025
Top patents by PatentIndex Score
47 records- 0182US7454885B2Tray to tube manual exchangerKING YUAN ELECTRONICS CO LTD·Filed 2006·Granted Nov 25, 2008·13 cites·13 claims
- 0268US7847571B2Semiconductor test system with self-inspection of electrical channel for Pogo towerKING YUAN ELECTRONICS CO LTD·Filed 2009·Granted Dec 7, 2010·5 cites·10 claims
- 0368US2026036616A1Cover opening and closing equipmentKING YUAN ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0466US8008938B2Testing system moduleKING YUAN ELECTRONICS CO LTD·Filed 2009·Granted Aug 30, 2011·4 cites·9 claims
- 0565US7629803B1Probe card assembly and test probes thereinKING YUAN ELECTRONICS CO LTD·Filed 2008·Granted Dec 8, 2009·4 cites·19 claims
- 0663US8010468B2Method for wafer analysis with artificial neural network and system thereofKING YUAN ELECTRONICS CO LTD·Filed 2007·Granted Aug 30, 2011·5 cites·34 claims
- 0762US2026056250A1Automated burn-in test systemKING YUAN ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0861US7591495B2Pick-up head device with a pushing mechanismKING YUAN ELECTRONICS CO LTD·Filed 2006·Granted Sep 22, 2009·2 cites·12 claims
- 0961US2025347736A1Dynamic burn-in test system and method thereofKING YUAN ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1057US7870527B2Method for stacked pattern design of printed circuit board and system thereofKING YUAN ELECTRONICS CO LTD·Filed 2008·Granted Jan 11, 2011·3 cites·31 claims
- 1157US7710134B2Probe card assemblyKING YUAN ELECTRONICS CO LTD·Filed 2008·Granted May 4, 2010·2 cites·4 claims
- 1256US2026059699A1Liquid cooling testing deviceKING YUAN ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1355US7821277B2Parallel test fixture for mixed signal integrated circuitsKING YUAN ELECTRONICS CO LTD·Filed 2008·Granted Oct 26, 2010·2 cites·11 claims
- 1453US7804315B2Probe cardKING YUAN ELECTRONICS CO LTD·Filed 2009·Granted Sep 28, 2010·2 cites·6 claims
- 1553US2026072074A1Pressing module capable of multi-point force application and multi-point temperature control and semiconductor packaging component testing device having the sameKING YUAN ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1653US2010191203A1System and equipment for persons with stomaKING YUAN ELECTRONICS CO LTD·Filed 2009·Application pending·0 cites
- 1752US8030944B2Method for continuity test of integrated circuitKING YUAN ELECTRONICS CO LTD·Filed 2008·Granted Oct 4, 2011·1 cites·13 claims
- 1852US7924039B2Self-cleaning package testing socketKING YUAN ELECTRONICS CO LTD·Filed 2009·Granted Apr 12, 2011·1 cites·8 claims
- 1952US7303125B2Apparatus and method of automatically counting a carrier tapeKING YUAN ELECTRONICS CO LTD·Filed 2005·Granted Dec 4, 2007·1 cites·13 claims
- 2051US7639028B2Probe card assembly with ZIF connectorsKING YUAN ELECTRONICS CO LTD·Filed 2007·Granted Dec 29, 2009·4 cites·6 claims
- 2148US7938611B2Feeding apparatus of test equipmentKING YUAN ELECTRONICS CO LTD·Filed 2005·Granted May 10, 2011·1 cites·10 claims
- 2248US7890820B2Semiconductor test system with self-inspection of memory repair analysisKING YUAN ELECTRONICS CO LTD·Filed 2009·Granted Feb 15, 2011·5 cites·6 claims
- 2348US7617924B2Tray transportation deviceKING YUAN ELECTRONICS CO LTD·Filed 2007·Granted Nov 17, 2009·2 cites·20 claims
- 2448US7369957B2Method and system for generating test pulses to test electronic elementsKING YUAN ELECTRONICS CO LTD·Filed 2007·Granted May 6, 2008·2 cites·11 claims
- 2547US7737711B2Test apparatus having pogo probes for chip scale packageKING YUAN ELECTRONICS CO LTD·Filed 2008·Granted Jun 15, 2010·3 cites·13 claims
- 2646US11500012B2Semiconductor component burn-in test module and burn-in test equipmentKING YUAN ELECTRONICS CO LTD·Filed 2020·Granted Nov 15, 2022·0 cites·13 claims
- 2746US11300611B2Image test system and test assembly thereofKING YUAN ELECTRONICS CO LTD·Filed 2020·Granted Apr 12, 2022·0 cites·18 claims
- 2846US9921269B2Comparison device and method for comparing test pattern files of a wafer testerKING YUAN ELECTRONICS CO LTD·Filed 2014·Granted Mar 20, 2018·0 cites·13 claims
- 2944US7772861B2Probe cardKING YUAN ELECTRONICS CO LTD·Filed 2008·Granted Aug 10, 2010·0 cites·4 claims
- 3043US7786744B2Probe card assembly and test probes thereinKING YUAN ELECTRONICS CO LTD·Filed 2008·Granted Aug 31, 2010·0 cites·12 claims
- 3143US2007074633A1Multi-axes inkerKING YUAN ELECTRONICS CO LTD·Filed 2005·Application pending·0 cites
- 3241US9116064B2Structure of built-in self-test for pressure tester and method thereofKING YUAN ELECTRONICS CO LTD·Filed 2012·Granted Aug 25, 2015·0 cites·13 claims
- 3341US7701233B2Heat-resistant lens kitKING YUAN ELECTRONICS CO LTD·Filed 2007·Granted Apr 20, 2010·2 cites·6 claims
- 3441US2024153890A1Semiconductor package assembly and semiconductor package substrate moduleKING YUAN ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 3538US12504412B2Titration module, test apparatus and method for measuring titration contact anglesKING YUAN ELECTRONICS CO LTD·Filed 2021·Granted Dec 23, 2025·0 cites·24 claims
- 3638US2008267488A1Apparatus and method for monitoring overlapped objectKING YUAN ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 3737US7501809B2Electronic component handling and testing apparatus and method for electronic component handling and testingKING YUAN ELECTRONICS CO LTD·Filed 2007·Granted Mar 10, 2009·2 cites·36 claims
- 3836US11693042B2Image test system, test assembly and image capture cardKING YUAN ELECTRONICS CO LTD·Filed 2021·Granted Jul 4, 2023·0 cites·16 claims
- 3936US2007018673A1Electronic component testing apparatusKING YUAN ELECTRONICS CO LTD·Filed 2005·Application pending·0 cites
- 4036US2010119345A1Position-returning mechanism for a pick-and-place apparatusKING YUAN ELECTRONICS CO LTD·Filed 2009·Application pending·0 cites
- 4134US10247747B2Titration module of biochip and tiration test apparatus thereofKING YUAN ELECTRONICS CO LTD·Filed 2017·Granted Apr 2, 2019·0 cites·11 claims
- 4233US7688087B2Test apparatusKING YUAN ELECTRONICS CO LTD·Filed 2007·Granted Mar 30, 2010·0 cites·7 claims
- 4333US7688093B2Sharing conversion board for testing chipsKING YUAN ELECTRONICS CO LTD·Filed 2008·Granted Mar 30, 2010·0 cites·10 claims
- 4432US2006260648A1Apparatus and method of automatically cleaning a pick-up headKING YUAN ELECTRONICS CO LTD·Filed 2005·Application pending·0 cites
- 4531US2008174331A1Structure of test area for a semiconductor testerKING YUAN ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 4629US8009896B2Coplanarity inspection device for printed circuit boardsKING YUAN ELECTRONICS CO LTD·Filed 2008·Granted Aug 30, 2011·0 cites·11 claims
- 4721US7973548B2Semiconductor test equipment with concentric pogo towersKING YUAN ELECTRONICS CO LTD·Filed 2009·Granted Jul 5, 2011·0 cites·9 claims
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