Assignee

KIRK MICHAEL D

US·2 granted patents·25 citations·filing 2007–2012

Technology mixG01N2

Top patents by PatentIndex Score

2 records

0192US8422010B2Methods and systems for determining a characteristic of a waferKIRK MICHAEL D·Filed 2012·Granted Apr 16, 2013·13 cites·34 claims
0287US8284394B2Methods and systems for determining a characteristic of a waferKIRK MICHAEL D·Filed 2007·Granted Oct 9, 2012·12 cites·36 claims

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