Assignee
KO FRANCIS
TW·4 granted patents·19 citations·filing 2007–2010
Top patents by PatentIndex Score
4 records- 0182US8682466B2Automatic virtual metrology for semiconductor wafer result predictionKO FRANCIS·Filed 2008·Granted Mar 25, 2014·13 cites·17 claims
- 0272US8716867B2Forming interconnect structures using pre-ink-printed sheetsKO FRANCIS·Filed 2010·Granted May 6, 2014·3 cites·19 claims
- 0365US9037279B2Clustering for prediction models in process control and for optimal dispatchingKO FRANCIS·Filed 2010·Granted May 19, 2015·1 cites·20 claims
- 0464US8409993B2Method and system for controlling copper chemical mechanical polish uniformityKO FRANCIS·Filed 2007·Granted Apr 2, 2013·2 cites·9 claims
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