Assignee
KOJIMA YOSHIAKI
JP·1 granted patent·1 pending application·2 citations·filing 2005–2006
Top patents by PatentIndex Score
2 records- 0165US8289384B2Electron beam displacement measuring method, electron beam displacement measuring device, and electron beam recording apparatusKOJIMA YOSHIAKI·Filed 2005·Granted Oct 16, 2012·2 cites·3 claims
- 0238US2010047717A1Method for manufacturing original masterKOJIMA YOSHIAKI·Filed 2006·Application pending·0 cites
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